Title :
Precession electron diffraction & automated crystallite orientation/phase mapping in a transmission electron microscope
Author :
Moeck, Peter ; Rouvimov, Sergei ; Häusler, Ines ; Neumann, Wolfgang ; Nicolopoulos, Stavros
Author_Institution :
Dept. of Phys., Portland State Univ., Portland, OR, USA
Abstract :
The basics of precession electron diffraction (PED) in a transmission electron microscope (TEM) are briefly discussed. An automated system for the mapping of nanocrystal phases and orientations in a TEM is briefly described. This system is primarily based on the projected reciprocal lattice geometry as extracted from experimental precession electron diffraction spot patterns. Comprehensive open-access crystallographic databases may be used in support of the automated crystallite phase identification process and are, therefore, also briefly mentioned.
Keywords :
electron diffraction crystallography; field emission electron microscopy; PED; TEM; automated crystallite orientation; automated crystallite phase identification process; nanocrystal phase; open-access crystallographic database; phase mapping; precession electron diffraction; reciprocal lattice geometry; spot pattern; transmission electron microscope; Correlation; Diffraction; Electron beams; Gallium arsenide; Microscopy; Reflection; X-ray diffraction; Nanometrology; Precession Electron Diffraction; Transmission Electron Microscopy;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4577-1514-3
Electronic_ISBN :
1944-9399
DOI :
10.1109/NANO.2011.6144300