• DocumentCode
    322421
  • Title

    Influence of growth conditions on structure, composition homogeneity and mechanical properties of thermoelectric crystals for coolers

  • Author

    Bublik, V.T. ; Karataev, V.V. ; Osvenski, V.B. ; Sagalova, T.B. ; Ufimtsev, V.B. ; Frolov, A.M.

  • Author_Institution
    Inst. of Chem. Probs. for Microelectron., Moscow Inst. of Steel & Alloys, Russia
  • fYear
    1997
  • fDate
    26-29 Aug 1997
  • Firstpage
    118
  • Lastpage
    121
  • Abstract
    The object of this work is to produce by economical method (vertical zone melting) the polycrystalline textured ingots of p- and n-type thermoelectric materials (TEM) based on antimony and bismuth tellurides and selenides solid solutions with high performance parameters (thermoelectric figure-of-merit Z) and diameter not less than 20 mm. Following problems were to be solved: a) the formation of favorable crystallographic orientation with minimum scatter which allows to make use of properties anisotropy to achieve maximum value of Z; b) preparation of solid solutions with reasonably homogeneous composition (along and across the ingot) and reproducible alloying level; c) elucidation of causes of mechanical stresses, that are responsible for cracking, to produce material with adequate mechanical properties. The texture, phase composition, macro- and microscale composition inhomogeneity of solid solution have been studied with X-ray diffraction methods by evaluation of lattice parameter and smearing (broadening) of diffraction maxima. In addition, microheterogeneity was assessed by microhardness measurements coupled with local elemental microanalysis (local X-ray microprobe). The cracking pattern was correlated with microstructure features (using optical metallography and X-ray topography). The slip lines formed by indenter prints during microhardness measurements were used for evaluation of cross-sectional disorder of adjacent grains, whose cleavage planes are parallel to ingot axis
  • Keywords
    X-ray diffraction; antimony compounds; bismuth compounds; crystal growth from melt; crystal structure; microhardness; semiconductor materials; thermoelectric power; 20 mm; Bi2Se3; Bi2Te3; Sb2Se; Sb2Te3; X-ray diffraction methods; composition homogeneity; crystallographic orientation; growth conditions; lattice parameter; mechanical properties; mechanical stresses; microhardness measurements; smearing; structure; thermoelectric crystals; thermoelectric figure-of-merit; Bismuth; Crystalline materials; Crystallography; Mechanical factors; Optical diffraction; Optical scattering; Solids; Thermoelectricity; X-ray diffraction; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 1997. Proceedings ICT '97. XVI International Conference on
  • Conference_Location
    Dresden
  • ISSN
    1094-2734
  • Print_ISBN
    0-7803-4057-4
  • Type

    conf

  • DOI
    10.1109/ICT.1997.666989
  • Filename
    666989