Title :
Peltier cooling of superconducting electronics
Author :
Straehle, J.W. ; Rath, S. ; Klingesberger, K.-J. ; Nissel, T. ; Doettinger, S.G. ; Doettinger, Chr A. ; Huebener, R.P. ; Kemmler-Sack, S.
Author_Institution :
Phys. Inst., Tubingen Univ., Germany
Abstract :
The increase of the superconducting transition temperature in some of the cuprate superconductors to values higher than 130 K is generating strong interest in the exploration of Peltier cooling for the operation of superconducting electronics. In this case, we need materials with a sufficiently large figure of merit z down to temperatures near 100 K. We have performed measurements of the Seebeck coefficient, the thermal conductivity and the electric resistivity in the temperature range 80-300 K of Bi2Te3-based materials with admixtures of Sb and Se, and studied the influence of pulverization and sintering. The resulting z-values are reported. The influence of sintering on the microstructure of the samples has been studied by SEM
Keywords :
Peltier effect; Seebeck effect; antimony compounds; bismuth compounds; ceramics; cooling; crystal microstructure; electrical resistivity; high-temperature superconductors; low-temperature production; scanning electron microscopy; semiconductor materials; sintering; superconducting integrated circuits; thermal conductivity; (BiSb)2(TeSe)3; 80 to 300 K; Bi2Te3-based materials; Peltier cooling; SEM; Sb; Se; Seebeck coefficient; cuprate superconductors; electric resistivity; figure of merit; microstructure; pulverization; sintering; superconducting electronics; superconducting transition temperature; thermal conductivity; Conducting materials; Conductivity measurement; Electric variables measurement; Electronics cooling; Performance evaluation; Superconducting materials; Superconducting transition temperature; Superconductivity; Temperature distribution; Thermal conductivity;
Conference_Titel :
Thermoelectrics, 1997. Proceedings ICT '97. XVI International Conference on
Conference_Location :
Dresden
Print_ISBN :
0-7803-4057-4
DOI :
10.1109/ICT.1997.666993
