Title :
Design optimization in write speed of multi-level cell application for phase change memory
Author :
Lin, Jun-Tin ; Liao, Yi-Bo ; Chiang, Meng-Hsueh ; Chiu, I-Hsuan ; Lin, Chia-Long ; Hsu, Wei-Chou ; Chiang, Pei-Chia ; Sheu, Shyh-Shyuan ; Hsu, Yen-Ya ; Liu, Wen-Hsing ; Su, Keng-Li ; Kao, Ming-Jer ; Tsai, Ming-Jinn
Author_Institution :
Dept. of Electron. Eng., Nat. Ilan Univ., Ilan, Taiwan
Abstract :
Design optimization to improve write speed of phase change memory is shown achievable by using a physical yet analytical compact PCM model. Our simulation results suggested that the write speed of continuous pulse programming scheme can be optimized and is superior to slow quenching scheme for multi-level cell application.
Keywords :
phase change memories; continuous pulse programming scheme; multilevel cell application; phase change memory; quenching scheme; write speed; Amorphous materials; Analytical models; Crystallization; Design optimization; Electrical resistance measurement; Logic; Nonvolatile memory; Phase change materials; Phase change memory; Temperature; MLC; PCM; Phase change memory;
Conference_Titel :
Electron Devices and Solid-State Circuits, 2009. EDSSC 2009. IEEE International Conference of
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-4297-3
Electronic_ISBN :
978-1-4244-4298-0
DOI :
10.1109/EDSSC.2009.5394196