• DocumentCode
    322435
  • Title

    Microstructures and thermoelectric properties of spin-cast Co0.97Cr0.03Sb3 ribbons

  • Author

    Morimura, T. ; Kitagawa, H. ; Hasaka, M. ; Kondo, S.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nagasaki Univ., Japan
  • fYear
    1997
  • fDate
    26-29 Aug 1997
  • Firstpage
    356
  • Lastpage
    359
  • Abstract
    The ribbons of Co0.97Cr0.03Sb3 were fabricated by spin-casting on a rotating copper roll with the surface-velocity of 3-50 m/s and were annealed for 10.8 ks at 873 K. The microstructures were investigated by means of X-ray diffraction measurements, scanning and transmission electron microscopic observations. The thermoelectromotive force and electrical conductivity were measured under a vacuum. As the surface-velocity increases, the amount of CoSb3 in the as-cast ribbon decreases, because the peritectic reaction of CoSb2+L→CoSb3 is suppressed due to rapid cooling. After annealing, the amount of CoSb3 increases with increasing the surface-velocity, because the reaction of CoSb2+Sb→CoSb3 proceeds more sufficiently during annealing. The morphology of crystal grains and lattice defects depend on the surface-velocity. As the surface-velocity increases, the thermoelectromotive force of the as-cast ribbon decreases, but the one of the annealed ribbon increases prior to decreasing. The maximum thermoelectromotive force and electrical conductivity, resulting in the maximum power factor, are attained at the surface velocity of 10 m/s
  • Keywords
    X-ray diffraction; chromium compounds; cobalt compounds; crystal microstructure; grain boundaries; grain size; scanning electron microscopy; semiconductor materials; thermoelectric power; transmission electron microscopy; 10.8 ks; 873 K; Co0.97Cr0.03Sb3; SEM; X-ray diffraction; crystal grains; electrical conductivity; lattice defects; microstructures; morphology; peritectic reaction; spin-cast Co0.97Cr0.03Sb3 ribbons; thermoelectric properties; thermoelectromotive force; transmission electron microscopy; Annealing; Chromium; Conductivity; Copper; Force measurement; Microstructure; Surface morphology; Thermal force; Thermoelectricity; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 1997. Proceedings ICT '97. XVI International Conference on
  • Conference_Location
    Dresden
  • ISSN
    1094-2734
  • Print_ISBN
    0-7803-4057-4
  • Type

    conf

  • DOI
    10.1109/ICT.1997.667152
  • Filename
    667152