DocumentCode
3224355
Title
OPTODET - tool to model LWIR and MWIR region for HgCdTe photodetectors
Author
Muralidharan, Pradyumna ; Wijewarnasuriya, Priyalal S. ; Vasileska, Dragica
Author_Institution
Sch. of Electr., Comput. & Energy Eng., Arizona State Univ., Tempe, AZ, USA
fYear
2011
fDate
15-18 Aug. 2011
Firstpage
554
Lastpage
558
Abstract
The tool OPTODET has been developed to investigate and explain the device characteristics of p+-n HgCdTe Photodetector at low temperatures. In this paper the performance of narrow band gap Hg1-xCdxTe (x=0.225) at 78 K and wide band gap Hg1-xCdxTe (x=0.3) at 250 K have been analyzed. Our theoretical model considers complete Fermi-Dirac statistics and all the major recombination mechanisms. The performance of the device has been studied and simulated as a function of parameters such as doping and temperature. The dark current - voltage characteristics have been simulated and analyzed theoretically. Dark Current as low as ID=10-10 was obtained at 78 K. For x=0.225, a peak detectivity of 1.558 × 1011 mHz1/2/W was obtained.
Keywords
electron-hole recombination; mercury alloys; narrow band gap semiconductors; photodetectors; quantum statistical mechanics; wide band gap semiconductors; Fermi-Dirac statistics; LWIR; MWIR; OPTODET; dark current-voltage characteristics; narrow band gap; photodetectors; wide band gap; Absorption; Charge carrier processes; Materials; Mathematical model; Noise; Photodetectors; Tunneling; Auger recombination; HgCdTe; Infrared Photodetectors; OPTODET;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location
Portland, OR
ISSN
1944-9399
Print_ISBN
978-1-4577-1514-3
Electronic_ISBN
1944-9399
Type
conf
DOI
10.1109/NANO.2011.6144311
Filename
6144311
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