• DocumentCode
    3224355
  • Title

    OPTODET - tool to model LWIR and MWIR region for HgCdTe photodetectors

  • Author

    Muralidharan, Pradyumna ; Wijewarnasuriya, Priyalal S. ; Vasileska, Dragica

  • Author_Institution
    Sch. of Electr., Comput. & Energy Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2011
  • fDate
    15-18 Aug. 2011
  • Firstpage
    554
  • Lastpage
    558
  • Abstract
    The tool OPTODET has been developed to investigate and explain the device characteristics of p+-n HgCdTe Photodetector at low temperatures. In this paper the performance of narrow band gap Hg1-xCdxTe (x=0.225) at 78 K and wide band gap Hg1-xCdxTe (x=0.3) at 250 K have been analyzed. Our theoretical model considers complete Fermi-Dirac statistics and all the major recombination mechanisms. The performance of the device has been studied and simulated as a function of parameters such as doping and temperature. The dark current - voltage characteristics have been simulated and analyzed theoretically. Dark Current as low as ID=10-10 was obtained at 78 K. For x=0.225, a peak detectivity of 1.558 × 1011 mHz1/2/W was obtained.
  • Keywords
    electron-hole recombination; mercury alloys; narrow band gap semiconductors; photodetectors; quantum statistical mechanics; wide band gap semiconductors; Fermi-Dirac statistics; LWIR; MWIR; OPTODET; dark current-voltage characteristics; narrow band gap; photodetectors; wide band gap; Absorption; Charge carrier processes; Materials; Mathematical model; Noise; Photodetectors; Tunneling; Auger recombination; HgCdTe; Infrared Photodetectors; OPTODET;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
  • Conference_Location
    Portland, OR
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4577-1514-3
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2011.6144311
  • Filename
    6144311