DocumentCode :
322436
Title :
Thermoelectric properties of Fe1-xNixSb3 ribbons
Author :
Hasaka, M. ; Kitagawa, H. ; Matano, K. ; Morimura, T. ; Kondo, S.
Author_Institution :
Dept. of Mater. Sci. & Eng., Nagasaki Univ., Japan
fYear :
1997
fDate :
26-29 Aug 1997
Firstpage :
360
Lastpage :
363
Abstract :
This paper deals with the microstructures and thermoelectric properties of Fe1-xNixSb3 ribbons between x=0 and 1.0. The ribbons were fabricated by casting on a rotating copper roll with the surface velocity of 10 m/s, and then annealed for 3.6 ks at 873 K. The microstructures were investigated by means of X-ray diffraction measurements and transmission electron microscopic observations. The CoAs3 type of structure, namely skutterudite structure, appeared as well as the other structures of FeSb 2, NiSb2 and Sb below x=0.45 and above 0.55. Only the skutterudite appeared and the other structures disappeared between x=0.45 and 0.55. The thermoelectromotive force and electrical resistivity were measured under a vacuum from 300 K to 670 K. The thermoelectromotive force was of p-type of semiconductor for x<0.5 and of n-type for x>0.5. The electrical resistivity recorded a maximum at x=0.5. The curve of electrical resistivity versus x was asymmetric at x=0.5. The electrical resistivity was larger for x<0.5 than for x>0.5 at the same deviation from x=0.5. The power factor, which was estimated from the thermoelectromotive force and electrical resistivity, reached to maximums at x=0.4 and x=0.6, and was small at x=0.5 at 300 K
Keywords :
X-ray diffraction; crystal microstructure; electrical resistivity; iron compounds; nickel compounds; semiconductor materials; thermoelectric power; transmission electron microscopy; (FeNi)Sb3; 3.6 ks; 300 to 670 K; 873 K; Fe1-xNixSb3 ribbons; X-ray diffraction; electrical resistivity; microstructures; skutterudite; thermoelectric properties; thermoelectromotive force; transmission electron microscopy; Annealing; Casting; Copper; Electric resistance; Force measurement; Iron; Microstructure; Thermal force; Thermoelectricity; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 1997. Proceedings ICT '97. XVI International Conference on
Conference_Location :
Dresden
ISSN :
1094-2734
Print_ISBN :
0-7803-4057-4
Type :
conf
DOI :
10.1109/ICT.1997.667153
Filename :
667153
Link To Document :
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