Title :
Characterization of p-type PbEuTe/PbTe MQW structures with high thermoelectric figures of merit in the PbTe quantum wells
Author :
Harman, T.C. ; Spears, D.L. ; Calawa, D.R. ; Groves, S.H. ; Walsh, M.P.
Author_Institution :
Lincoln Lab., MIT, Lexington, MA, USA
Abstract :
A large enhancement in the Seebeck coefficient, thermoelectric power factor and figure of merit (Z2DT) is reported in very high carrier concentration p-type PbTe quantum wells grown by molecular beam epitaxy. The estimated Z2DT (using accepted bulk values for lattice thermal conductivity) is as high as 1.5 at 300 K. Power factor values up to 160 μWcm-1K-2 were measured at 300 K, indicating a power factor in p-type quantum wells that is approximately five times the best bulk or homogeneous p-type value. Thinner barriers yielded lower thermoelectric power factors and figures of merit. The high power factor was achieved with a barrier thickness less than half that previously used to demonstrate enhanced thermoelectric power factors in n-type quantum wells. X-ray diffraction/reflection characterization results of the multiple-quantum-well (MQW) structures at both low and high Bragg angles yield precise values for the MQW periodicity
Keywords :
IV-VI semiconductors; Seebeck effect; X-ray diffraction; europium compounds; hole density; interface structure; lead compounds; semiconductor quantum wells; semiconductor superlattices; 300 K; MQW periodicity; PbEuTe-PbTe; PbTe quantum wells; Seebeck coefficient; X-ray diffraction/reflection characterization; barrier thickness; figure of merit; high Bragg angles; high carrier concentration; high thermoelectric figures of merit; lattice thermal conductivity; low Bragg angles; molecular beam epitaxy; p-type PbEuTe/PbTe MQW structures; p-type PbTe quantum wells; p-type quantum wells; power factor values; thermoelectric power factor; Conductivity measurement; Lattices; Molecular beam epitaxial growth; Power measurement; Quantum well devices; Reactive power; Thermal conductivity; Thermal factors; Thermoelectricity; X-ray diffraction;
Conference_Titel :
Thermoelectrics, 1997. Proceedings ICT '97. XVI International Conference on
Conference_Location :
Dresden
Print_ISBN :
0-7803-4057-4
DOI :
10.1109/ICT.1997.667169