Title :
Probing protein-protein interaction forces using single-molecule force spectroscopy
Author :
Li, Mi ; Liu, Lianqing ; Xi, Ning ; Wang, Yuechao ; Dong, Zaili ; Li, Guangyong ; Xiao, Xiubin ; Zhang, Weijing
Author_Institution :
State Key Lab. of Robot., Shenyang Inst. of Autom., Shenyang, China
Abstract :
The invention of atomic force microscopy (AFM) provides new technology for measuring the molecular specific binding forces. With the use of AFM single-molecule force spectroscopy (SMFS), the CD20-rituximab binding forces were measured on purified CD20 proteins (CD20 segment protein and CD20 full-length protein) and on Burkitt´s lymphoma Raji cells, respectively. With AFM probe functionalization technology, rituximabs were linked onto AFM tips. With substrate functionalization technology, purified CD20 segment proteins and CD20 full-length proteins were attached onto mica. Lymphoma Raji cells were immobilized onto glass substrate with electrostatic adsorption and chemical fixation. The differences of measuring the binding forces on purified proteins and on cells were analyzed. The experimental results indicate that the binding force between CD20 segment protein and rituximab were markedly larger than that of CD20 full-length protein and CD20 protein on lymphoma cells, providing an effective method for investigating the rituximab´s mechanism.
Keywords :
atomic force microscopy; binding energy; biological techniques; cellular biophysics; molecular biophysics; proteins; AFM probe functionalization technology; AFM single molecule force spectroscopy; Burkitt´s lymphoma Raji cells; CD20 full length protein; CD20 segment protein; CD20-rituximab binding forces; SMFS; atomic force microscopy; chemical fixation; electrostatic adsorption; glass substrate; mica surface; molecular specific binding forces; protein-protein interaction forces; purified CD20 proteins; substrate functionalization technology; Force; Force measurement; Histograms; Probes; Proteins; Substrates; Surface topography;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4577-1514-3
Electronic_ISBN :
1944-9399
DOI :
10.1109/NANO.2011.6144328