DocumentCode :
3224789
Title :
An accurate analytical model for current-voltage characteristics and transconductance of AlmGa1−m/GaN MODFETs
Author :
Abtahi Hosseini, S.E. ; Hosseini, Seyed Ebrahim
Author_Institution :
Dept. of Electr. Eng., Univ. of Sabzevar, Sabzevar, Iran
fYear :
2009
fDate :
25-27 Dec. 2009
Firstpage :
412
Lastpage :
415
Abstract :
In this paper, a simple and accurate analytical model for current-voltage and Transconductance characteristics of AlmGa1-m/GaN modulation doped field effect transistors (MODFETs) devices is presented. In proposed model, the effects of spontaneous and piezoelectric polarization at the hetero-interface and gate-voltage dependence of the Fermi level are considered. Variation of drain current after saturation, parasitic resistance of drain and source, field-dependent mobility, are contained in the model and gate to source dependant is utilized for the low field mobility. By implement model in MATLAB current-voltage characteristics and transconductance have been obtained. The agreement between the model and experimental result validate the proposed analytical model.
Keywords :
Fermi level; III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; semiconductor device models; wide band gap semiconductors; AlGa-GaN; Fermi level; MATLAB; MODFET; current-voltage characteristics; drain current; field-dependent mobility; modulation doped field effect transistors; parasitic resistance; piezoelectric polarization; spontaneous polarization; transconductance; Analytical models; Current-voltage characteristics; Epitaxial layers; FETs; Gallium nitride; HEMTs; MODFETs; Mathematical model; Piezoelectric polarization; Transconductance; AlGaN/GaN; MODFET; low-field mobility; sheet carrier concentration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits, 2009. EDSSC 2009. IEEE International Conference of
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-4297-3
Electronic_ISBN :
978-1-4244-4298-0
Type :
conf
DOI :
10.1109/EDSSC.2009.5394228
Filename :
5394228
Link To Document :
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