Crystallographic image processing for Scanning Probe Microscopy: Development of a dedicated computer program

Author

Bilyeu, Taylor T. ; Moon, Bill, Jr. ; Straton, Jack C. ; Moeck, Peter

Author_Institution

Dept. of Phys., Portland State Univ., Portland, OR, USA

fYear

2011

fDate

15-18 Aug. 2011

Firstpage

651

Lastpage

656

Abstract

The crystallographic processing of 2D periodic Scanning Probe Microscopy (SPM) images is compared to the common practice of Crystallographic Image Processing (CIP) in transmission electron microscopy (TEM). This provides motivation for the development of a dedicated computer program for CIP in SPM. The current state of our program is briefly described, and the point spread function (PSF) of an atomic force microscope (AFM) is extracted from experimental images through CIP. The use of a geometric Akaike information criterion (AIC) to supplement standard CIP procedures is discussed in some detail.

Keywords

atomic force microscopy; crystallography; image processing; optical transfer function; transmission electron microscopy; 2D periodic scanning probe microscopy images; AFM; AIC; CIP; SPM images; TEM; atomic force microscope; computer program; crystallographic image processing; geometric Akaike information criterion; point spread function; transmission electron microscopy; Calibration; Communities; Lattices; Microscopy; Shape; Vectors; Image Processing; Scanning Probe Microscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on

Conference_Location

Portland, OR

ISSN

1944-9399

Print_ISBN

978-1-4577-1514-3

Electronic_ISBN

1944-9399

Type

conf

DOI

10.1109/NANO.2011.6144352

Filename

6144352