Title :
Improvement of reproducibility of DPI method to quantify RF conducted immunity of LDO regulator
Author :
Matsushima, Takaaki ; Ikehara, Nobuaki ; Hisakado, Takashi ; Wada, O.
Author_Institution :
Dept. of Electr. Eng., Kyoto Univ., Katsura, Japan
Abstract :
In this paper, we discussed the reproducibility of the direct RF power injection method. Transmission and reflection characteristics of the measurement setup affected the evaluation of immunity. Also, the common-mode generation at the connection of the DC supply cable should be reduced using the common-mode absorption devices.
Keywords :
electromagnetic wave reflection; electromagnetic wave transmission; voltage regulators; DC supply cable; DPI method; LDO regulator; RF conducted immunity; common-mode absorption devices; common-mode generation; direct RF power injection method; measurement setup; reflection characteristics; reproducibility improvement; transmission characteristics; Immunity testing; Power cables; Radio frequency; Regulators; Transmission line measurements; Voltage control;
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013 9th Intl Workshop on
Conference_Location :
Nara
DOI :
10.1109/EMCCompo.2013.6735173
