DocumentCode
3225510
Title
Characterization of the adhesion between nanoparticles and polymer matrix by atomic force microscopy
Author
Chung, Wenchiang R. ; Amo, Karl
Author_Institution
Dept. of Chem. & Mater. Eng., San Jose State Univ., San Jose, CA, USA
fYear
2011
fDate
15-18 Aug. 2011
Firstpage
897
Lastpage
902
Abstract
Mechanical properties of a nano-composite consisting of nano-particles (e.g. carbon nanotubes, graphene, or nanoplatelets) embedded in a polymer matrix can be enhanced by manipulating the interfacial interactions between the nanoparticle and the polymer matrix. Polymer-nanoparticle adhesion allows the transfer of stress to the reinforcing particles which results in an increase in material strength. On the other hand, polymer-nanoparticle bonds can absorb energy by breaking and forming microvoids; the formation of microvoids during deformation increases toughness (impact strength). Hence, an investigation of the interfacial bonding strength and related interaction characteristics using Atomic force microscopy (AFM) is conducted. Two techniques (force/distance curve and extend distance curve) are proposed, and their advantages and limitations are addressed in this paper.
Keywords
adhesion; atomic force microscopy; bonding processes; carbon nanotubes; deformation; filled polymers; fracture toughness; impact strength; nanocomposites; nanofabrication; nanoparticles; particle reinforced composites; surface morphology; voids (solid); AFM; C; atomic force microscopy; carbon nanotubes; deformation; force-distance curve; fracture toughness; graphene; impact strength; interfacial bonding strength; interfacial interactions; material strength; mechanical properties; microvoids; nanocomposites; nanoplatelets; particle reinforcement composite; polymer-nanoparticle adhesion; surface morphology; Coatings; Force; Force measurement; Piezoelectric actuators; Polymers; Probes; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location
Portland, OR
ISSN
1944-9399
Print_ISBN
978-1-4577-1514-3
Electronic_ISBN
1944-9399
Type
conf
DOI
10.1109/NANO.2011.6144373
Filename
6144373
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