DocumentCode :
3225602
Title :
A high gain lateral BJT on thin film silicon substrate
Author :
Homayoni, Faranak ; Hosseini, Seyed Ebrahim ; Baedi, Javad
Author_Institution :
Dept. of Electron. Eng., Tarbiat Moallem Univ. of Sabzevar, Sabzevar, Iran
fYear :
2009
fDate :
25-27 Dec. 2009
Firstpage :
278
Lastpage :
281
Abstract :
In this paper, a symmetric dual-emitter LBJT (SDE LBJT) structure on TFSOI substrates has been designed and simulated, and suitable doping profiles are used for improving LBJT performance. Simulations show that the device has good DC characteristics. The SDE LBJT with a base length of 0.2 ¿m can achieve a current gain over 1500, which is 7.5 times improvement in current gain, in comparison to the LBJT reported previously. Also has good current drive and high frequency capability. These results indicate that the SDE LBJT structure is suitable for many low power mixed mode applications.
Keywords :
CMOS integrated circuits; bipolar transistors; doping profiles; thin film transistors; CMOS technology; Si; TFSOI substrates; current gain; doping profiles; good DC characteristics; high frequency capability; high gain lateral BJT; size 0.2 mum; symmetric dual-emitter LBJT structure; thin film substrate; CMOS technology; Costs; Doping profiles; Germanium silicon alloys; Performance gain; Semiconductor thin films; Silicon germanium; Silicon on insulator technology; Substrates; Voltage; Current gain; Lateral BJT; SOI;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits, 2009. EDSSC 2009. IEEE International Conference of
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-4297-3
Electronic_ISBN :
978-1-4244-4298-0
Type :
conf
DOI :
10.1109/EDSSC.2009.5394267
Filename :
5394267
Link To Document :
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