Title :
Analysis on the effect of regression and correlation models on the accuracy of Kriging model for IC
Author :
Hailang, Wang ; Hailong, You ; Xinzhang, Jia
Author_Institution :
Sch. of Microelectron., Xidian Univ., Xi´´an, China
Abstract :
To solve the problem of low efficiency using physical model in circuit simulation, a surrogate Kriging model is introduced and discussed in this paper. Taking the example of an RF amplifier, contrast of effects of different regression and correlation models on the accuracy of Kriging model built is given. Based on analysis of the result, useful strategies for choosing optimal regression and correlation models are proposed.
Keywords :
circuit simulation; correlation methods; integrated circuits; regression analysis; Kriging model; RF amplifier; circuit simulation; correlation models; integrated circuit; regression models; Artificial neural networks; Circuit simulation; Computational modeling; Design for experiments; Geology; Integrated circuit modeling; Minerals; Predictive models; Radiofrequency amplifiers; Stochastic processes; IC modeling; Kriging; correlation model; regression model;
Conference_Titel :
Electron Devices and Solid-State Circuits, 2009. EDSSC 2009. IEEE International Conference of
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-4297-3
Electronic_ISBN :
978-1-4244-4298-0
DOI :
10.1109/EDSSC.2009.5394268
