Title :
A diagnosis method of DC/DC converter aging based on the variation of parasitic
Author :
Tae-Jin, Kim ; Baek, Ju-Won ; Jeon, Jin-Hong ; Rim, Geun-Hie ; Kim, Cheul-U
Author_Institution :
Power Electron. Res. Group, Korea Electrotechnol. Res. Inst., Changwon, South Korea
Abstract :
In this paper, we propose a new diagnosis method of DC/DC converter aging. The method is based on the variations of parasitic resistor for the aging process. We apply an on-line diagnosis of DC/DC converter from the system point of view, not device-wise, but a system. This study proposes a method of DC/DC converter diagnosis by analyzing the variations of model on the variations of parasitic resistor.
Keywords :
DC-DC power convertors; ageing; resistors; DC-DC converter aging; on-line diagnosis method; parasitic resistor; Accidents; Aging; Communication industry; DC-DC power converters; Industrial electronics; Machinery; Noise measurement; Resistors; Semiconductor device noise; Temperature sensors;
Conference_Titel :
Industrial Electronics Society, 2004. IECON 2004. 30th Annual Conference of IEEE
Print_ISBN :
0-7803-8730-9
DOI :
10.1109/IECON.2004.1432296
