Title :
Characterization of conducted emission at high frequency under different temperature
Author :
Berbel, Nestor ; Fernandez-Garcia, Raul ; Gil, Iñigo
Author_Institution :
Dept. of Electron. Eng., Univ. Politec. de Catalunya (UPC), Terrassa, Spain
Abstract :
In this paper, the characterization of the EMC conducted emissions of integrated circuits under different temperature stress condition, up to 3 GHz is presented. The impact of high temperature has been measured on the input impedance of propagation paths of the electromagnetic conducted emissions, as well as on the electromagnetic noise of a clock generator.
Keywords :
clocks; electromagnetic compatibility; noise generators; EMC conducted emissions; clock generator; different temperature; electromagnetic noise; high frequency; integrated circuits; propagation paths; temperature stress condition; Electromagnetic compatibility; Impedance; Integrated circuit modeling; Noise; Temperature measurement; Transmission line measurements; EMC; Integrated circuit; conducted emission; switching noise; temperature impact;
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013 9th Intl Workshop on
Conference_Location :
Nara
DOI :
10.1109/EMCCompo.2013.6735190
