DocumentCode
3225853
Title
Characterization of conducted emission at high frequency under different temperature
Author
Berbel, Nestor ; Fernandez-Garcia, Raul ; Gil, Iñigo
Author_Institution
Dept. of Electron. Eng., Univ. Politec. de Catalunya (UPC), Terrassa, Spain
fYear
2013
fDate
15-18 Dec. 2013
Firstpage
147
Lastpage
151
Abstract
In this paper, the characterization of the EMC conducted emissions of integrated circuits under different temperature stress condition, up to 3 GHz is presented. The impact of high temperature has been measured on the input impedance of propagation paths of the electromagnetic conducted emissions, as well as on the electromagnetic noise of a clock generator.
Keywords
clocks; electromagnetic compatibility; noise generators; EMC conducted emissions; clock generator; different temperature; electromagnetic noise; high frequency; integrated circuits; propagation paths; temperature stress condition; Electromagnetic compatibility; Impedance; Integrated circuit modeling; Noise; Temperature measurement; Transmission line measurements; EMC; Integrated circuit; conducted emission; switching noise; temperature impact;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013 9th Intl Workshop on
Conference_Location
Nara
Type
conf
DOI
10.1109/EMCCompo.2013.6735190
Filename
6735190
Link To Document