Title :
Using the EM simulation tools to predict the Conducted Emissions level of a DC/DC boost converter: Introducing EBEM-CE model
Author :
Durier, Andre ; Marot, Christian ; Crepel, Olivier
Author_Institution :
Continental Automotive France SAS, Toulouse, France
Abstract :
DC/DC Boost Converters are commonly used in the electronics industry to provide a raised voltage to a specific function. These converters are constituted by a basic commutation cell (Inductor-MOS transistor-diode-capacitor) managed by an integrated circuit realizing voltage and current control typically running between 100 and 500 kHz. This control´s frequency creates high conducted Electromagnetic noise which could cause troubles on the supply network. We propose to use a SPICE modeling to estimate the conducted noise on supply network during CISPR 25 CE measurements. Then, we will intend to build an EBEM-CE model of the converter from these measurements.
Keywords :
DC-DC power convertors; MOSFET; capacitors; electric current control; inductors; voltage control; CISPR 25 CE measurements; DC-DC boost converter; EBEM-CE model; EM simulation tools; MOS transistor-diode-capacitor; SPICE modeling; basic commutation cell; conducted emissions level; conducted noise; current control; electromagnetic noise; electronics industry; inductor; supply network; voltage control; Current measurement; Electromagnetic compatibility; Integrated circuit modeling; Noise; SPICE; Voltage measurement; CISPR 25 Conducted Emissions; DC/DC Boost Converter; EBEM CE model; SPICE modeling;
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013 9th Intl Workshop on
Conference_Location :
Nara
DOI :
10.1109/EMCCompo.2013.6735191