The direct RF power injection method up to 18 GHz for investigating IC´s susceptibility

Author

Yin-Cheng Chang ; Hsu, Shawn S. H. ; Yen-Tang Chang ; Chiu-Kuo Chen ; Hsu-Chen Cheng ; Da-Chiang Chang

Author_Institution

Nat. Chip Implementation Center, Nat. Appl. Res. Labs., Hsinchu, Taiwan

fYear

2013

fDate

15-18 Dec. 2013

Firstpage

167

Lastpage

170

Abstract

The direct RF power injection (DPI) measurement up to 18 GHz is proposed to investigate the IC immunity. The DPI method is reviewed and the consideration of extending frequency range is discussed. Furthermore, the details of the measurement setup are depicted in this work. The critical part, on-board injection network in the power injection path with a 3 dB bandwidth of 18.7 GHz is realized. A low dropout regulator (LDO) is used to demonstrate the test setup. The proposed DPI test with the experimental results shows the significance up to 18 GHz.

Keywords

integrated circuit measurement; integrated circuit testing; microwave integrated circuits; power integrated circuits; DPI; IC susceptibility; LDO; bandwidth 18.7 GHz; direct RF power injection measurement method; gain 3 dB; low dropout regulator; on-board injection network; Bandwidth; Frequency measurement; Immunity testing; Integrated circuits; Radio frequency; Standards; DPI; EMC; immunity; integrated circuit;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013 9th Intl Workshop on

Conference_Location

Nara

Type

conf

DOI

10.1109/EMCCompo.2013.6735194

Filename

6735194