Title :
The direct RF power injection method up to 18 GHz for investigating IC´s susceptibility
Author :
Yin-Cheng Chang ; Hsu, Shawn S. H. ; Yen-Tang Chang ; Chiu-Kuo Chen ; Hsu-Chen Cheng ; Da-Chiang Chang
Author_Institution :
Nat. Chip Implementation Center, Nat. Appl. Res. Labs., Hsinchu, Taiwan
Abstract :
The direct RF power injection (DPI) measurement up to 18 GHz is proposed to investigate the IC immunity. The DPI method is reviewed and the consideration of extending frequency range is discussed. Furthermore, the details of the measurement setup are depicted in this work. The critical part, on-board injection network in the power injection path with a 3 dB bandwidth of 18.7 GHz is realized. A low dropout regulator (LDO) is used to demonstrate the test setup. The proposed DPI test with the experimental results shows the significance up to 18 GHz.
Keywords :
integrated circuit measurement; integrated circuit testing; microwave integrated circuits; power integrated circuits; DPI; IC susceptibility; LDO; bandwidth 18.7 GHz; direct RF power injection measurement method; gain 3 dB; low dropout regulator; on-board injection network; Bandwidth; Frequency measurement; Immunity testing; Integrated circuits; Radio frequency; Standards; DPI; EMC; immunity; integrated circuit;
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013 9th Intl Workshop on
Conference_Location :
Nara
DOI :
10.1109/EMCCompo.2013.6735194
