• DocumentCode
    3225970
  • Title

    Multilayer thin-film capacitors fabricated by radio-frequency magnetron sputtering

  • Author

    Imamiya, Yuji ; Yokokawa, Ryuji ; Kanno, Isaku ; Kotera, Hidetoshi

  • Author_Institution
    Dept. of Micro Eng., Kyoto Univ., Kyoto, Japan
  • fYear
    2011
  • fDate
    24-27 July 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this study, we fabricate multilayer ceramic capacitors (MLCCs) composed of BaTiO3 (BT) dielectric layers with Pt internal electrodes by radio frequency magnetron sputtering. We deposited BT layers with thickness of approximately 300 nm on Pt/Ti-coated SiO2/Si substrates through a movable shadow mask. The isolated internal Pt electrodes are prepared by sliding the shadow mask. Multilayered BT thin films are uniformly deposited on a Si substrate with external electrodes on both sides of the BT films. The formation of a polycrystalline perovskite structure was confirmed by XRD measurement. The MLCCs with five BT layers exhibit excellent dielectric properties: a relative dielectric constant of approximately 320 and a dielectric loss of around 2% regardless of the number of dielectric layers.
  • Keywords
    X-ray diffraction; barium compounds; ceramic capacitors; dielectric losses; dielectric thin films; masks; permittivity; sputtered coatings; thin film capacitors; BaTiO3; MLCC; Pt-Ti-SiO2-Si; Si; Si substrate; XRD; dielectric layers; dielectric loss; dielectric properties; internal electrodes; movable shadow mask; multilayer ceramic capacitors; multilayer thin-film capacitors; polycrystalline perovskite structure; radio frequency magnetron sputtering; radio-frequency magnetron sputtering; relative dielectric constant; Ceramics; Dielectrics; Electrodes; Nonhomogeneous media; Silicon; Sputtering; Substrates; BT thin films; Multilayer ceramic capacitor; Suputtering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics (ISAF/PFM), 2011 International Symposium on and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    978-1-4577-1162-6
  • Electronic_ISBN
    978-1-4577-1161-9
  • Type

    conf

  • DOI
    10.1109/ISAF.2011.6013988
  • Filename
    6013988