Title :
Electro-magnetic robustness of integrated circuits: from statement to prediction
Author :
Ben Dhia, S. ; Boyer, A.
Author_Institution :
LAAS, Univ. de Toulouse, Toulouse, France
Abstract :
EMRIC project, a new research activity mixing integrated circuits electromagnetic compatibility (EMC) and integrated circuits (ICs) reliability, provides methods and guidelines to circuits and equipment designers to ensure EMC during lifetime of their applications. In order to improve the ICs electromagnetic robustness (EMR) this project studies the effect of ICs ageing on electromagnetic emission and immunity to radio frequency interferences, clarifies the link between IC degradations and related EMC drifts and develops prediction models and propose “time insensitive” EMC protection structures.
Keywords :
electromagnetic compatibility; integrated circuit modelling; integrated circuit reliability; EMC drifts; EMRIC project; IC degradations; electromagnetic emission; electromagnetic robustness; integrated circuits electromagnetic compatibility; integrated circuits reliability; radio frequency interferences; Aging; Degradation; Immunity testing; Integrated circuits; Stress; Transistors; EMC modelling; Integrated circuits; accelerated aging; electromagnetic compatibility; reliability; robustness;
Conference_Titel :
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013 9th Intl Workshop on
Conference_Location :
Nara
DOI :
10.1109/EMCCompo.2013.6735202
