• DocumentCode
    3226261
  • Title

    Magnetic field coupling on analog-to-digital converter from wireless power transfer system in automotive environment

  • Author

    Bumhee Bae ; Sunkyu Kong ; Kim, Jonghoon J. ; Sukjin Kim ; Joungho Kim

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon, South Korea
  • fYear
    2013
  • fDate
    15-18 Dec. 2013
  • Firstpage
    238
  • Lastpage
    242
  • Abstract
    There are multiple electrical devices on automotive system, which are control devices, communication devices, and digital devices. Each electrical device can generate magnetic field, one of the critical radiated electro-magnetic interference (EMI) elements. The operating frequency of each device is different and it means that the bandwidth of magnetic field is wide. Therefore, the strong magnetic fields can degrade the performance of diverse semiconductor systems in automotive applications, but it is not well discussed yet, even though the malfunction of electrical devices on automotive system is related to safe issues. So, we focus on strong magnetic field effects of semiconductor system. Among strong magnetic field source, we targeted wireless power transfer (WPT) system, which is spotlighted and promising technology for automotive and mobile charging system and significant magnetic field source. Furthermore, we choose analog-to-digital converter (ADC), sensitive to external noise and critical system involved in control devices related to the safety issues of automobile, as a targeted semiconductor system. In this paper, we discuss the magnetic coupling path and describe how to estimate the magnetic field effects on ADC with WPT. To estimate and analyze the targeted effects on ADC, we designed the ADC using a 0.13um CMOS process and WPT system using printed circuit board (PCB). Consequently, the magnetic field couples to ADC system, and there are three methods to estimate performance degradation of ADC by magnetic field effects, one is modeling, another is simulation, and the other is measurement.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; automotive electronics; electromagnetic interference; magnetic field effects; printed circuits; ADC; CMOS; analog-to-digital converter; automotive environment; magnetic field coupling; magnetic field effects; performance degradation; printed circuit board; size 0.13 mum; wireless power transfer system; Couplings; Electromagnetic compatibility; Magnetic fields; Noise; Ports (Computers); Power supplies; Wireless communication; Strong magnetic field; analog-to-digital converter; electromagnetic interference; electromagnetic susceptibility; wireless power transfer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013 9th Intl Workshop on
  • Conference_Location
    Nara
  • Type

    conf

  • DOI
    10.1109/EMCCompo.2013.6735207
  • Filename
    6735207