• DocumentCode
    3226287
  • Title

    Immunity simulation method for automotive power module using electromagnetic analysis

  • Author

    Kondo, Yuta ; Tsunada, Kei ; Oka, Naoto ; Izumichi, Masato

  • Author_Institution
    Electron. Device Bus. Unit, DENSO Corp., Kariya, Japan
  • fYear
    2013
  • fDate
    15-18 Dec. 2013
  • Firstpage
    243
  • Lastpage
    248
  • Abstract
    This paper provides an immunity simulation method for product-level automotive power modules that contain printed circuit boards (PCBs). A stress-strength model is adopted as an estimation method for the susceptibility. The stress is the value of the RF power injected into a victim circuit, and the strength is the acceptance stress criteria of the victim circuit. By using electromagnetic simulation, the stress of the victim circuit is calculated. The strength of the victim circuit is determined by the DPI test result. By comparing the stress and strength of the victim circuit, the susceptibility thresholds can be predicted. The results show good agreement with the experimental results in the DPI test for a power module containing a complex product-level PCB and exhibit a good correlation with the BCI test for the power module.
  • Keywords
    automotive electrics; automotive electronics; electromagnetic compatibility; printed circuits; BCI test; DPI test; PCB; RF power; acceptance stress criteria; automotive power module; complex product-level PCB; electromagnetic analysis; electromagnetic simulation; immunity simulation method; printed circuit boards; product-level automotive power modules; stress-strength model; susceptibility estimation method; susceptibility threshold; victim circuit strength; victim circuit stress; Integrated circuit modeling; MOSFET; Radio frequency; Stress; Temperature sensors; BCI; DPI; Electromagnetic analysis; RF immunity; Stress-strength model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013 9th Intl Workshop on
  • Conference_Location
    Nara
  • Type

    conf

  • DOI
    10.1109/EMCCompo.2013.6735208
  • Filename
    6735208