DocumentCode
3226287
Title
Immunity simulation method for automotive power module using electromagnetic analysis
Author
Kondo, Yuta ; Tsunada, Kei ; Oka, Naoto ; Izumichi, Masato
Author_Institution
Electron. Device Bus. Unit, DENSO Corp., Kariya, Japan
fYear
2013
fDate
15-18 Dec. 2013
Firstpage
243
Lastpage
248
Abstract
This paper provides an immunity simulation method for product-level automotive power modules that contain printed circuit boards (PCBs). A stress-strength model is adopted as an estimation method for the susceptibility. The stress is the value of the RF power injected into a victim circuit, and the strength is the acceptance stress criteria of the victim circuit. By using electromagnetic simulation, the stress of the victim circuit is calculated. The strength of the victim circuit is determined by the DPI test result. By comparing the stress and strength of the victim circuit, the susceptibility thresholds can be predicted. The results show good agreement with the experimental results in the DPI test for a power module containing a complex product-level PCB and exhibit a good correlation with the BCI test for the power module.
Keywords
automotive electrics; automotive electronics; electromagnetic compatibility; printed circuits; BCI test; DPI test; PCB; RF power; acceptance stress criteria; automotive power module; complex product-level PCB; electromagnetic analysis; electromagnetic simulation; immunity simulation method; printed circuit boards; product-level automotive power modules; stress-strength model; susceptibility estimation method; susceptibility threshold; victim circuit strength; victim circuit stress; Integrated circuit modeling; MOSFET; Radio frequency; Stress; Temperature sensors; BCI; DPI; Electromagnetic analysis; RF immunity; Stress-strength model;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2013 9th Intl Workshop on
Conference_Location
Nara
Type
conf
DOI
10.1109/EMCCompo.2013.6735208
Filename
6735208
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