• DocumentCode
    322637
  • Title

    Technical and performance aspects of a dynamic voltage restorer

  • Author

    Chan, K.

  • Author_Institution
    Syst. Eng. Div., ABB High Voltage Technol. Ltd., Switzerland
  • fYear
    1998
  • fDate
    35837
  • Firstpage
    42491
  • Lastpage
    525
  • Abstract
    One of the major issues in improving power quality in distribution networks is the mitigation of voltage sags. Voltage sags in distribution networks caused by system faults can adversely affect sensitive electrical equipment in industrial production processes, such as in semiconductor fabrication, resulting in substantial financial losses. A safe, reliable and clean power supply to these industries is therefore a prerequisite to their profitable operation. A dynamic voltage restorer (DVR), with its excellent dynamic capabilities, when installed between the supply and a critical load feeder, can compensate for voltage sags, restoring line voltage to its nominal value within a few milliseconds and hence avoiding any power disruption to that load. This paper presents the technical aspects of designing an integrated gate commutated thyristor (IGCT) based DVR shown, a new device capable of meeting the stringent requirements of voltage sags mitigation. Furthermore, performance assessments of the DVR using a real-time hardware simulator model and computer simulations are discussed
  • Keywords
    distribution networks; clean power supply; computer simulations; critical load feeder; distribution networks; dynamic capabilities; dynamic voltage restorer; financial losses; industrial production processes; integrated gate commutated thyristor; line voltage restoration; power disruption; power quality improvement; real-time hardware simulator model; semiconductor fabrication; sensitive electrical equipment; system faults; voltage sags compensation; voltage sags mitigation;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Dynamic Voltage Restorers - Replacing Those Missing Cycles (Digest No. 1998/189), IEE Half Day Colloquium on
  • Conference_Location
    Glasgow
  • Type

    conf

  • DOI
    10.1049/ic:19980012
  • Filename
    668170