DocumentCode :
3226502
Title :
Multiscale modeling of wurtzite InN/GaN quantum Dot LEDs
Author :
Yalavarthi, Krishna ; Sundaresan, Sasi ; Ahmed, Shaikh
Author_Institution :
Dept. of Electr. & Comput. Eng., Southern Illinois Univ. at Carbondale, Carbondale, IL, USA
fYear :
2011
fDate :
15-18 Aug. 2011
Firstpage :
881
Lastpage :
886
Abstract :
The objective of this paper is to study the (competing) effects of various internal (built-in) fields on the electronic structure and optical properties of wurtzite InN/GaN quantum dot light emitting diodes (LEDs). A multiscale approach has been employed where: 1) the atomistic NEMO 3-D tool is used to calculate the strain distribution and one-particle electronic states, and 2) using the NEMO 3-D outputs, the Synopsys TCAD tool is then used to determine the terminal electrical and optical properties of the device. A list of the main findings is as follows: 1) Internal fields are long-ranged and their proper treatment demands simulation of realistically extended structures with millions of atoms; 2) Electronic structures show unconventional characteristics related to level shifts, non-degeneracy in the excited P states, and rotation (symmetry breaking) of the wavefunctions; and 3) Internal fields in these nanostructured LEDs lead to strong suppression in the interband optical transitions (near the center of the Brillouin zone) and the conversion efficiency.
Keywords :
III-V semiconductors; electronic structure; excited states; gallium compounds; indium compounds; light emitting diodes; optical properties; quantum dots; spontaneous symmetry breaking; wide band gap semiconductors; InN-GaN; electronic structure; excited states; light emitting diodes; multiscale modeling; one-particle electronic states; optical properties; quantum dot LED; strain distribution; symmetry breaking; wurtzite; Atom optics; Atomic layer deposition; Gallium nitride; Light emitting diodes; Optical polarization; Quantum dots; Strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location :
Portland, OR
ISSN :
1944-9399
Print_ISBN :
978-1-4577-1514-3
Electronic_ISBN :
1944-9399
Type :
conf
DOI :
10.1109/NANO.2011.6144420
Filename :
6144420
Link To Document :
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