DocumentCode :
3227134
Title :
Expert System Simulation of Hardware
Author :
Leinweber, L. ; Singh, Bawa ; Papachristou, C.
fYear :
2013
fDate :
4-6 Nov. 2013
Firstpage :
207
Lastpage :
212
Abstract :
Hardware lint tools based on static analysis techniques only check for structural, coding and consistency problems in RTL code. They have the limitation that they do not perform behavioral analysis and have a predefined rule-base that is not enhanced by users to capture human expertise. We present RTL-CLIPS, an RTL simulation environment based on CLIPS, an open-source expert system shell. In our approach, we do a semantically equivalent translation of RTL code into CLIPS facts. The simulator can be used by an heuristic rule-base to perform dynamic analysis of RTL code. Our method can better approximate design behavior by augmenting the pattern-matching capability of the CLIPS expert system with an environment for RTL simulation. We demonstrate our approach by analyzing ITC99 benchmark circuits. We discuss how our approach supports the reverse engineering of design behavior from RTL code.
Keywords :
C language; circuit simulation; expert system shells; hardware description languages; logic design; pattern matching; program diagnostics; program interpreters; public domain software; reverse engineering; system-on-chip; C Language Integrated Production System; CLIPS expert system; ITC99 benchmark circuits; RTL code translation; RTL simulation environment; RTL-CLIPS; behavioral analysis; coding problems; consistency problems; design behavior; dynamic analysis; expert system simulation; hardware lint tools; heuristic rule-base; open-source expert system shell; pattern matching capability; reverse engineering; static analysis techniques; structural problems; Clocks; Expert systems; Hardware design languages; Integrated circuit modeling; Reactive power; Reverse engineering; Expert system; Hardware simulation; RTL analysis; Reverse engineering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Tools with Artificial Intelligence (ICTAI), 2013 IEEE 25th International Conference on
Conference_Location :
Herndon, VA
ISSN :
1082-3409
Print_ISBN :
978-1-4799-2971-9
Type :
conf
DOI :
10.1109/ICTAI.2013.40
Filename :
6735251
Link To Document :
بازگشت