DocumentCode
3227349
Title
SOI implementation of low-voltage and high-temperature MOSFET-C continuous-time filters
Author
Dessard, V. ; Baldwin, D. ; Demeûs, L. ; Gentinne, B. ; Flandre, D.
Author_Institution
Microelectron. Lab., Katholieke Univ., Leuven, Belgium
fYear
1996
fDate
30 Sep-3 Oct 1996
Firstpage
24
Lastpage
25
Abstract
Thin-film fully-depleted (FD) SOI MOSFETs are very promising for the implementation of highly-linear MOS resistors. It has been demonstrated both theoretically and experimentally that, due to their low body effect, the drain current of FD SOI MOS structures presents much lower signal distortion than bulk Si counterparts, when the transistors are biased in the strong-inversion linear regime and a sine signal is applied at the source or drain terminal, the gate voltage being used as a DC control voltage for fine tuning of resistor value. Balanced structures combining one or two MOS pairs-to attenuate odd or odd-and-even order harmonics respectively-are used to implement continuous-time (CT) filters of the MOSFET-C type which are of great interest for the integration of low-voltage analog filters. This work discusses the first SOI MOSFET-C filter implementations and investigates their potential for low-voltage and high-temperature applications. Basic first-order sections are first studied to gain physical insight on the problem but can next be cascaded to generate higher-order filters as is finally demonstrated
Keywords
CMOS analogue integrated circuits; cascade networks; continuous time filters; harmonic distortion; silicon-on-insulator; MOS pairs; MOSFET-C continuous-time filters; SOI implementation; Si; active filters; balanced structures; cascaded sections; drain current; first-order sections; harmonics; high-temperature applications; highly-linear MOS resistors; low body effect; low-voltage analog filters; signal distortion; strong-inversion linear regime; thin-film fully-depleted SOI MOSFETs; Degradation; Electrical resistance measurement; Immune system; Impedance; Low pass filters; MOSFET circuits; Resistors; Temperature; Tuning; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 1996. Proceedings., 1996 IEEE International
Conference_Location
Sanibel Island, FL
ISSN
1078-621X
Print_ISBN
0-7803-3315-2
Type
conf
DOI
10.1109/SOI.1996.552475
Filename
552475
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