Title :
Testability and test architectures
Author :
Hare, Mike ; Sicola, Steve
Author_Institution :
Digital Equipment Corp., Colorado Springs, CO, USA
Abstract :
The authors define testability and describe the benefits derived from its inclusion in products. Myths about testability are presented. Test architectures that help to maximize the chances of successfully achieving test goals while minimizing hardware and software costs are described.<>
Keywords :
electronic equipment testing; hardware costs; software costs; test architectures; testability; Circuit faults; Circuit testing; Design engineering; Electrical fault detection; Fault detection; Hardware; Logic testing; Manufacturing processes; Software testing; Test equipment;
Conference_Titel :
IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'
Conference_Location :
Colorado Springs, CO, USA
DOI :
10.1109/REG5.1988.15922
