• DocumentCode
    3227803
  • Title

    Testability and test architectures

  • Author

    Hare, Mike ; Sicola, Steve

  • Author_Institution
    Digital Equipment Corp., Colorado Springs, CO, USA
  • fYear
    1988
  • fDate
    21-23 March 1988
  • Firstpage
    161
  • Lastpage
    166
  • Abstract
    The authors define testability and describe the benefits derived from its inclusion in products. Myths about testability are presented. Test architectures that help to maximize the chances of successfully achieving test goals while minimizing hardware and software costs are described.<>
  • Keywords
    electronic equipment testing; hardware costs; software costs; test architectures; testability; Circuit faults; Circuit testing; Design engineering; Electrical fault detection; Fault detection; Hardware; Logic testing; Manufacturing processes; Software testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE Region 5 Conference, 1988: 'Spanning the Peaks of Electrotechnology'
  • Conference_Location
    Colorado Springs, CO, USA
  • Type

    conf

  • DOI
    10.1109/REG5.1988.15922
  • Filename
    15922
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3227803