• DocumentCode
    3227832
  • Title

    Optoelectronics at NIST

  • Author

    Day, G.W.

  • Author_Institution
    Optoelectron. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    2
  • fYear
    1995
  • fDate
    30 Oct-2 Nov 1995
  • Firstpage
    73
  • Abstract
    Research in optoelectronics has a long history at NIST (NBS). The Optics Division, one of the first divisions formed after NBS was established in 1901, was initially charged with work on radiometry, spectroscopy, and polarimetry. Over the next five or six decades optics remained a significant topic of research, though the Optics Division eventually disappeared and the work became more scattered. Within a year of Maiman´s first demonstration of the ruby laser in 1960, a similar laser was constructed at the NBS-Boulder Laboratories. Demands for assistance in measuring the power or energy produced by such lasers led to the establishment of laser calibration services beginning in 1967. Another early program was aimed at developing techniques for laser frequency stabilization and absolute frequency and wavelength measurements. That effort culminated in 1972 with the determination ofa much improved value for the speed of light, which led ultimately to a redefinition of the meter. Today, approximately 140 NIST staff, scattered through six of the eight NIST Laboratories, work in optoelectronics. Providing the optoelectronics industry with advanced measurement technology continues to be a major thrust, but optoelectronics is also an important tool in other areas of metrology. A brief introduction to some of the NIST optoelectronics programs is given. Additional information, including contacts in various areas of research can be found at the NIST World Wide Web Site (http://www.nist.gov)
  • Keywords
    calibration; measurement standards; optoelectronic devices; project engineering; NIST; National Institute of Standards and Technology; advanced measurement technology; energy; frequency measurements; laser calibration services; laser frequency stabilization; metrology; optoelectronics; optoelectronics industry; polarimetry; power; radiometry; ruby laser; spectroscopy; speed of light; wavelength measurements; Frequency; History; Laboratories; Light scattering; NIST; Optical scattering; Power lasers; Radiometry; Spectroscopy; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1995. 8th Annual Meeting Conference Proceedings, Volume 1., IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-2450-1
  • Type

    conf

  • DOI
    10.1109/LEOS.1995.484603
  • Filename
    484603