DocumentCode
3227889
Title
Coaxial tips for infrared NSOM
Author
Hopkins, Michael ; Morakinyo, Moshood K. ; Rananavare, Shankar ; La Rosa, Andres ; Freeouf, John L.
Author_Institution
Dept. of Phys., Portland State Univ., Portland, OR, USA
fYear
2011
fDate
15-18 Aug. 2011
Firstpage
531
Lastpage
534
Abstract
We propose to use infrared light coupled with a near field scanning optical microscope (NSOM) to probe organic materials. The initial emphasis will be on the 2.8 - 3.25 μm range, which contains bands from both C - H and O - H stretching vibrations. This provides great sensitivity to specific chemical alterations as induced, e.g., in a photoresist by exposure and/or development. We have attempted to make IR NSOM probes by the fabrication of versatile coaxial nanostructures for their distinct use as waveguides supporting TEM modes free of frequency cut-off. We have modeled a conical coaxial structure for its losses at target areas with 2.8μm wavelength. Preliminary results indicate their potential as efficient and reproducible probes.
Keywords
nanofabrication; near-field scanning optical microscopy; optical microscopes; transmission electron microscopy; TEM modes; chemical alteration; coaxial nanostructures; coaxial tips; conical coaxial structure; infrared NSOM probe; infrared near field scanning optical microscope; light infrared; organic materials; photoresist; stretching vibration; transmission electron microscopy; waveguides; wavelength 2.8 mum to 3.25 mum; Conductors; Dielectrics; Gold; Nanoparticles; Probes; Wires; Infrared; NSOM; coaxial; vibrational spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location
Portland, OR
ISSN
1944-9399
Print_ISBN
978-1-4577-1514-3
Electronic_ISBN
1944-9399
Type
conf
DOI
10.1109/NANO.2011.6144482
Filename
6144482
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