• DocumentCode
    3227889
  • Title

    Coaxial tips for infrared NSOM

  • Author

    Hopkins, Michael ; Morakinyo, Moshood K. ; Rananavare, Shankar ; La Rosa, Andres ; Freeouf, John L.

  • Author_Institution
    Dept. of Phys., Portland State Univ., Portland, OR, USA
  • fYear
    2011
  • fDate
    15-18 Aug. 2011
  • Firstpage
    531
  • Lastpage
    534
  • Abstract
    We propose to use infrared light coupled with a near field scanning optical microscope (NSOM) to probe organic materials. The initial emphasis will be on the 2.8 - 3.25 μm range, which contains bands from both C - H and O - H stretching vibrations. This provides great sensitivity to specific chemical alterations as induced, e.g., in a photoresist by exposure and/or development. We have attempted to make IR NSOM probes by the fabrication of versatile coaxial nanostructures for their distinct use as waveguides supporting TEM modes free of frequency cut-off. We have modeled a conical coaxial structure for its losses at target areas with 2.8μm wavelength. Preliminary results indicate their potential as efficient and reproducible probes.
  • Keywords
    nanofabrication; near-field scanning optical microscopy; optical microscopes; transmission electron microscopy; TEM modes; chemical alteration; coaxial nanostructures; coaxial tips; conical coaxial structure; infrared NSOM probe; infrared near field scanning optical microscope; light infrared; organic materials; photoresist; stretching vibration; transmission electron microscopy; waveguides; wavelength 2.8 mum to 3.25 mum; Conductors; Dielectrics; Gold; Nanoparticles; Probes; Wires; Infrared; NSOM; coaxial; vibrational spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
  • Conference_Location
    Portland, OR
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4577-1514-3
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2011.6144482
  • Filename
    6144482