Title :
Visible (670 nm) vertical cavity surface emitting lasers with indium tin oxide transparent conducting top contacts
Author :
Thornton, R. ; Zou, Y. ; Tramontana, J. ; Hagerott Crawford, M. ; Schneider, R.P. ; Choquette, K.D.
Author_Institution :
Xerox Palo Alto Res. Center, CA, USA
fDate :
30 Oct-2 Nov 1995
Abstract :
One significant performance limiting parameter for top-surface emitting red VCSELs is the need for a top contacting surface which is both highly conducting and non-absorbing at the optical emission wavelength. The GaAs cap layer typically deposited on longer wavelength structures to facilitate contacting is strongly absorbing at 670 nm unless restricted to a thickness of only several nanometers. This compromises both the quality of the ohmic contact and the level of lateral conductivity achievable in red VCSEL structures which rely on lateral current flow for current injection. In this paper we report the use of indium tin oxide (ITO) as a transparent top surface contact for red VCSELs, resulting in substantial improvements in both turn on voltage and power output in these devices
Keywords :
electrodes; indium compounds; laser cavity resonators; light absorption; ohmic contacts; optical fabrication; optical films; semiconductor lasers; surface emitting lasers; transparency; 670 nm; GaAs; GaAs cap layer; ITO; InSnO; current injection; highly conducting; indium tin oxide; indium tin oxide transparent conducting top contacts; lateral conductivity; lateral current flow; limiting parameter; longer wavelength structures; non-absorbing; ohmic contact; optical emission wavelength; power output; red VCSEL structures; red VCSELs; top contacting surface; top-surface emitting red VCSELs; transparent top surface contact; turn on voltage; visible nm vertical cavity surface emitting lasers; Conductivity; Gallium arsenide; Indium tin oxide; Ohmic contacts; Optical surface waves; Stimulated emission; Surface emitting lasers; Surface waves; Vertical cavity surface emitting lasers; Voltage;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1995. 8th Annual Meeting Conference Proceedings, Volume 1., IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2450-1
DOI :
10.1109/LEOS.1995.484620