Title :
Effect of manganese and vanadium valences for the reliability of BaTiO3-based MLCCs
Author :
Natsui, Hidesada ; Shibahara, Takeshi ; Kido, Osamu
Author_Institution :
Mater. & Process Dev. Center, TDK Corp., Narita, Japan
Abstract :
The valences of manganese and vanadium oxides in multi-layer ceramic capacitors (MLCCs), sintered under a reducing atmosphere, were investigated using electron paramagnetic resonance, the insulation resistance degradation was analyzed using impedance spectroscopy in highly accelerated life time tests to clarify the manganese and vanadium influence on both the electrical properties and microstructure of MLCCs. The Mn2+ was stable in the reducing-atmosphere-sintered MLCCs, and formed a grain boundary. Vanadium mitigated the IR degradation and increased the reliability of the MLCCs. Although V4+ was detected in the 0.20 and 0.30 mol% vanadium-added MLCCs, the electrical properties were dependant upon the other ions, e.g., V3+ or V5+.
Keywords :
barium compounds; ceramic capacitors; grain boundaries; paramagnetic resonance; reliability; sintering; BaTiO3; IR degradation; V3+ ion; V5+ ion; electron paramagnetic resonance; grain boundary; impedance spectroscopy; insulation resistance degradation; manganese oxide; manganese valence effect; microstructure; multilayer ceramic capacitors; reducing-atmosphere-sintered MLCC; reliability; sintering; vanadium oxide; vanadium valence effect; Ceramics; Degradation; Grain boundaries; Manganese; Reliability; Resistance; EPR; MLCCs; manganese; reliability; vanadium;
Conference_Titel :
Applications of Ferroelectrics (ISAF/PFM), 2011 International Symposium on and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1162-6
Electronic_ISBN :
978-1-4577-1161-9
DOI :
10.1109/ISAF.2011.6014101
