DocumentCode
3228195
Title
High-speed low-power Single-Stage latched-comparator with improved gain and kickback noise rejection
Author
Kazeminia, Sarang ; Mousazadeh, Morteza ; Hadidi, Khayrollah ; Khoei, Abdollah
Author_Institution
Microelectron. Res. Lab., Urmia Univ., Urmia, Iran
fYear
2010
fDate
6-9 Dec. 2010
Firstpage
216
Lastpage
219
Abstract
This paper presents a high speed Single-Stage latched comparator which is scheduled in time for both amplification and latch operations. Small active area besides desired power consumption at high comparison rates qualifies the proposed comparator to be repeatedly employed in high speed flash A/D converters. A strategy of kickback noise elimination besides gain enhancement is also introduced. A low power holding Read-Out circuit is presented. Post-Layout simulation results confirm 500MS/s comparison rate with 5mv resolution for a 1.6v peak-to-peak input signal range and 600μw power consumption from a 3.3v power supply by using TSMC model of 0.35μm CMOS technology. Total active area of proposed comparator and Read-Out circuit is about 300μm2.
Keywords
CMOS digital integrated circuits; circuit noise; comparators (circuits); low-power electronics; CMOS technology; TSMC model; amplification operations; high speed single-stage latched comparator; kickback noise rejection; latch operations; low power holding read-out circuit; post-layout simulation; read-out circuit; size 0.35 mum; voltage 3.3 V; CMOS integrated circuits; CMOS technology; Inverters; Latches; Noise; Power demand; Preamplifiers;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (APCCAS), 2010 IEEE Asia Pacific Conference on
Conference_Location
Kuala Lumpur
Print_ISBN
978-1-4244-7454-7
Type
conf
DOI
10.1109/APCCAS.2010.5774848
Filename
5774848
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