• DocumentCode
    3228195
  • Title

    High-speed low-power Single-Stage latched-comparator with improved gain and kickback noise rejection

  • Author

    Kazeminia, Sarang ; Mousazadeh, Morteza ; Hadidi, Khayrollah ; Khoei, Abdollah

  • Author_Institution
    Microelectron. Res. Lab., Urmia Univ., Urmia, Iran
  • fYear
    2010
  • fDate
    6-9 Dec. 2010
  • Firstpage
    216
  • Lastpage
    219
  • Abstract
    This paper presents a high speed Single-Stage latched comparator which is scheduled in time for both amplification and latch operations. Small active area besides desired power consumption at high comparison rates qualifies the proposed comparator to be repeatedly employed in high speed flash A/D converters. A strategy of kickback noise elimination besides gain enhancement is also introduced. A low power holding Read-Out circuit is presented. Post-Layout simulation results confirm 500MS/s comparison rate with 5mv resolution for a 1.6v peak-to-peak input signal range and 600μw power consumption from a 3.3v power supply by using TSMC model of 0.35μm CMOS technology. Total active area of proposed comparator and Read-Out circuit is about 300μm2.
  • Keywords
    CMOS digital integrated circuits; circuit noise; comparators (circuits); low-power electronics; CMOS technology; TSMC model; amplification operations; high speed single-stage latched comparator; kickback noise rejection; latch operations; low power holding read-out circuit; post-layout simulation; read-out circuit; size 0.35 mum; voltage 3.3 V; CMOS integrated circuits; CMOS technology; Inverters; Latches; Noise; Power demand; Preamplifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (APCCAS), 2010 IEEE Asia Pacific Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-7454-7
  • Type

    conf

  • DOI
    10.1109/APCCAS.2010.5774848
  • Filename
    5774848