Title :
Electrical resistance response evaluation of semiconducting single-walled carbon nanotube film for X-ray sensing
Author :
Kang, Qingsheng ; Yeow, John T W
Author_Institution :
Dept. of Syst. Design Eng., Univ. of Waterloo, Waterloo, ON, Canada
Abstract :
The electrical resistance responses of a semiconducting single-walled carbon nanotube (SWCNT) film irradiated by 6MV and 15MV energy X-rays were evaluated. Results indicate that the dynamic responses exhibit fluctuations which may be an intrinsic feature of SWCNT networks due to the large number of interconnections between individual SWCNTs. The average resistance-dose rate relations of the SWCNT network are quasi-linear and can be used for dosimetry measurements in medical radiation applications.
Keywords :
X-ray detection; X-ray effects; carbon nanotubes; electric resistance; elemental semiconductors; interconnections; nanosensors; nanotube devices; semiconductor nanotubes; C; X-ray sensing; average resistance-dose rate relations; dosimetry measurements; dynamic responses; electrical resistance response evaluation; interconnections; medical radiation applications; semiconducting single-walled carbon nanotube film; single-walled carbon nanotube networks; voltage 15 MV; voltage 6 MV; Carbon nanotubes; Electrical resistance measurement; Films; Fluctuations; Immune system; Resistance; Nanotube; X-ray; dosimeter; electrical resistance;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4577-1514-3
Electronic_ISBN :
1944-9399
DOI :
10.1109/NANO.2011.6144504
