Ferro- and piezoelectric properties of (Bi3.25Nd0.75)Ti3O12 nanoplates epitaxially grown on Nb:TiO2(101) substrates by sputtering

Author

Kobune, Masafumi ; Tamura, Akihiro ; Imagawa, Kazuki ; Kishimoto, Ryo ; Nishioka, Hiroshi ; Nakashima, Seiji ; Fujisawa, Hironori ; Shimizu, Masaru ; Yamaguchi, Hideshi ; Honda, Koichiro

Author_Institution

Grad. Sch. of Eng., Univ. of Hyogo, Himeji, Japan

fYear

2011

fDate

24-27 July 2011

Firstpage

1

Lastpage

4

Abstract

Epitaxially a- and b-axis-oriented (Bi_3.25Nd_0.75)Ti₃O₁₂ (BNT-0.75) films and nanoplates have been fabricated on four Nb:TiO₂(101) substrates with 0-0.79 mass% Nb by high-temperature sputtering. It is shown from piezoresponse scanning force microscopy (PFM) measurements that the effective piezoelectric coefficients (d₃₃) at room temperature derived from the two linear gradients for the asymmetric displacement-voltage hysteresis loop are 11-13 pm/V.

Keywords

bismuth compounds; dielectric hysteresis; dielectric polarisation; epitaxial growth; ferroelectric materials; ferroelectric thin films; nanofabrication; nanostructured materials; neodymium compounds; piezoelectric thin films; piezoelectricity; scanning electron microscopy; sputter deposition; (Bi_3.25Nd_0.75)Ti₃O₁₂; TiO₂:Nb; asymmetric displacement-voltage hysteresis loop; b-axis oriented films; effective piezoelectric coefficients; epitaxial growth; ferroelectric properties; high-temperature sputtering; nanoplates; piezoelectric properties; piezoresponse scanning force microscopy; remanent polarization; temperature 293 K to 298 K; Crystals; Films; Hysteresis; Microscopy; Niobium; Sputtering; Substrates; effective d33; nanoplate; piezoelectric property; sputtering; ultrasonic transducer;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics (ISAF/PFM), 2011 International Symposium on and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials

Conference_Location

Vancouver, BC

Print_ISBN

978-1-4577-1162-6

Electronic_ISBN

978-1-4577-1161-9

Type

conf

DOI

10.1109/ISAF.2011.6014115

Filename

6014115