Title :
Lead-free BNT-BKT-BT thin films by pulsed laser deposition process
Author :
Hejazi, Mehdi ; Safari, Ahmad
Author_Institution :
Dept. of Mater. Sci. & Eng., Rutgers, State Univ. of New Jersey, Piscataway, NJ, USA
Abstract :
We have studied the effect of deposition parameters on the microstructure and ferroelectric properties of pulsed laser deposited 0.88(Bi0.5Na0.5)TiO3-0.08(Bi0.5K0.5)TiO3-0.04BaTiO3 thin films on SrRuO3 coated SrTiO3 substrates. The films were deposited at different repletion rates, substrate temperatures, and laser energies. It has been demonstrated that the film made at 800 °C, 10 Hz, 400 mtorr and 1.2 J.cm-2 shows the best ferroelectric properties among the investigated films. The remnant polarization for this film was measured to be about 30 μC.cm-2. We have also discussed the electrical conduction mechanisms in the temperature range of 200-350 K. At low electric fields, the leakage mechanism is governed by the ohmic conduction. With increasing the applied filed, an abrupt increase in the leakage current was observed. This was attributed to a trap-filling process by the injected carries. At sufficiently high electric fields, the leakage current obeyed the Child´s trap-free square law suggesting the space charge limited current was the dominant mechanism.
Keywords :
barium compounds; bismuth compounds; dielectric polarisation; electrical conductivity; ferroelectric thin films; leakage currents; potassium compounds; pulsed laser deposition; sodium compounds; space-charge-limited conduction; (Bi0.5Na0.5)TiO3-(Bi0.5K0.5)TiO3-BaTiO3; Child trap-free square law; SrRuO3-SrTiO3; SrTiO3; electrical conduction mechanism; ferroelectric properties; frequency 10 Hz; injected carries; lead-free BNT-BKT-BT thin films; microstructure; ohmic conduction; pressure 400 mtorr; pulsed laser deposition process; remnant polarization; space charge limited current; temperature 200 K to 350 K; temperature 800 degC; trap-filling process; Electric fields; Films; Leakage current; Pulsed laser deposition; Substrates; Temperature; Temperature measurement; BNT; lead-free ferroelectric; leakage curret; pulsed laser deposition; thin film;
Conference_Titel :
Applications of Ferroelectrics (ISAF/PFM), 2011 International Symposium on and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1162-6
Electronic_ISBN :
978-1-4577-1161-9
DOI :
10.1109/ISAF.2011.6014119