DocumentCode :
322879
Title :
Nonlinear analog DC fault simulation by one-step relaxation
Author :
Tian, Michael W. ; Shi, C. J Richard
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
fYear :
1998
fDate :
26-30 Apr 1998
Firstpage :
126
Lastpage :
131
Abstract :
Efficient methods have been developed for fault simulation of linear analog circuits. However, DC fault simulation of nonlinear analog circuits-a more practically-relevant problem-remains largely unexplored. In this paper, we propose an one-step relaxation approach to nonlinear DC fault simulation. In this approach, only one Newton-Raphson iteration is performed for the faulty circuit with the DC solution of the good circuit as the initial point, and the results are used to approximate the actual results of exact fault simulation. With one-step relaxation implemented using Householder´s formula, the proposed approach is numerically stable, and computationally efficient. It has a very simple circuit interpretation: the nonlinear circuit under test is modeled by a linearized circuit at its operating point, and faults are modeled as faults in the linearized circuit. Experiment results have demonstrated that the proposed approach achieves almost the same fault coverage as exact fault simulation for 29 MCNC Circuit Simulation Workshop benchmark circuits
Keywords :
Newton-Raphson method; analogue integrated circuits; circuit analysis computing; fault diagnosis; integrated circuit testing; nonlinear network analysis; numerical stability; relaxation theory; Householder formula; Newton-Raphson iteration; nonlinear analog DC fault simulation; nonlinear analog circuits; numerically stable method; one-step relaxation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Cities and towns; Computational modeling; Costs; Failure analysis; Microwave integrated circuits; SPICE;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1998. Proceedings. 16th IEEE
Conference_Location :
Monterey, CA
ISSN :
1093-0167
Print_ISBN :
0-8186-8436-4
Type :
conf
DOI :
10.1109/VTEST.1998.670859
Filename :
670859
Link To Document :
بازگشت