DocumentCode
3228900
Title
Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification
Author
Ogasahara, Yasuhiro ; Hashimoto, Masanori ; Onoye, Takao
Author_Institution
Osaka Univ., Suita
fYear
2008
fDate
21-24 March 2008
Firstpage
107
Lastpage
108
Abstract
This paper presents an all digital measurement circuit called "gated oscillator" for capturing waveforms of dynamic power supply noise. The gated oscillator is constructed with standard cells, and thus can be easily embedded in SoCs for design verification. The performance of the gated oscillator is verified with fabricated test chips in a 90 nm process.
Keywords
cellular arrays; integrated circuit noise; oscillators; system-on-chip; waveform analysis; SoC power integrity verification; design verification; digital measurement circuit; dynamic supply noise measurement circuit; gated oscillator; size 90 nm; standard cells; waveforms; Circuit noise; Delay; Integrated circuit measurements; Measurement standards; Noise measurement; Power measurement; Power supplies; Timing; Voltage; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2008. ASPDAC 2008. Asia and South Pacific
Conference_Location
Seoul
Print_ISBN
978-1-4244-1921-0
Electronic_ISBN
978-1-4244-1922-7
Type
conf
DOI
10.1109/ASPDAC.2008.4483917
Filename
4483917
Link To Document