Title :
Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification
Author :
Ogasahara, Yasuhiro ; Hashimoto, Masanori ; Onoye, Takao
Author_Institution :
Osaka Univ., Suita
Abstract :
This paper presents an all digital measurement circuit called "gated oscillator" for capturing waveforms of dynamic power supply noise. The gated oscillator is constructed with standard cells, and thus can be easily embedded in SoCs for design verification. The performance of the gated oscillator is verified with fabricated test chips in a 90 nm process.
Keywords :
cellular arrays; integrated circuit noise; oscillators; system-on-chip; waveform analysis; SoC power integrity verification; design verification; digital measurement circuit; dynamic supply noise measurement circuit; gated oscillator; size 90 nm; standard cells; waveforms; Circuit noise; Delay; Integrated circuit measurements; Measurement standards; Noise measurement; Power measurement; Power supplies; Timing; Voltage; Voltage-controlled oscillators;
Conference_Titel :
Design Automation Conference, 2008. ASPDAC 2008. Asia and South Pacific
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1921-0
Electronic_ISBN :
978-1-4244-1922-7
DOI :
10.1109/ASPDAC.2008.4483917
