• DocumentCode
    3228951
  • Title

    Stabilization and thickness dependence of depletion charge induced domains in ferroelectric nano capacitors

  • Author

    Misirlioglu, I.B. ; Yildiz, M.

  • Author_Institution
    Fac. of Eng. & Natural Sci., Sabanci Univ., Istanbul, Turkey
  • fYear
    2011
  • fDate
    24-27 July 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We analyze the domain structures as well as the phase transition temperatures in films with depletion charges. Due to depletion charges, saw-tooth like domain structures can develop spanning the entire film thickness in films with perfect electrode screening, i. e., ideal electrodes if the film is above a critical thickness. Transition temperature in films with dead layers does not depend nearly at all on the depletion charge density unless it is very high (>;1026 ionized impurities/m3). Relatively thick films (>;8 nm in this work) with dead layers that have very high depletion charge densities have transition temperatures similar to those with the same charge density but with ideal electrodes, making us conclude that thick films with high depletion charge densities will not feel the dead layer effects. The results are provided for (001) BaTiO3 films grown on (001) SrTiO3 substrates with pseudomorphic top and bottom metallic electrodes.
  • Keywords
    circuit stability; electrodes; ferroelectric capacitors; ferroelectric thin films; nanoelectronics; phase transformations; BaTiO3; SrTiO3; bottom metallic electrodes; dead layer effects; depletion charge density; depletion charge induced domains; electrode screening; ferroelectric nanocapacitors; film thickness dependence; phase transition temperatures; pseudomorphic metallic electrodes; sawtooth like domain structures; thick films; Diamond-like carbon; Electrodes; Electrostatics; Ferroelectric films; Impurities; Thick films; Ferroelectric films; depletion charge; electrostatics; phase transition; thermodynamic simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics (ISAF/PFM), 2011 International Symposium on and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    978-1-4577-1162-6
  • Electronic_ISBN
    978-1-4577-1161-9
  • Type

    conf

  • DOI
    10.1109/ISAF.2011.6014139
  • Filename
    6014139