DocumentCode :
322902
Title :
Robust temperature control in the measurement of high temperature vapor pressures
Author :
Ingram, J.E. ; Hodel, A.S. ; Kirkici, H.
Author_Institution :
Dept. of Electr. Eng., Auburn Univ., AL, USA
Volume :
1
fYear :
1997
fDate :
9-14 Nov 1997
Firstpage :
149
Abstract :
The problem of measuring the vapor pressure of high temperature materials likely to be used in a space environment is considered. The purpose of this experiment is to determine whether these materials are suitable for use as protective coatings for optical components and photovoltaic materials in a space environment. An ultra high vacuum (UHV) chamber is used to measure the vapor pressure of the candidate materials at elevated temperatures up to 2000 K and background vacuum pressures down to 10-8 Pa. Because the temperature of the sample must be constant during the experiments, an automated temperature control system is designed and constructed. In this paper, the results of the data and the temperature control system are discussed
Keywords :
protective coatings; robust control; temperature control; vapour pressure measurement; 10E-8 Pa; 2000 K; automated temperature control system; background vacuum pressures; high temperature vapor pressures measurement; optical components; photovoltaic materials; protective coatings; robust temperature control; space environment; ultra high vacuum chamber; Coatings; Extraterrestrial measurements; Optical devices; Optical materials; Pressure measurement; Protection; Robust control; Temperature control; Temperature measurement; Vacuum systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, Control and Instrumentation, 1997. IECON 97. 23rd International Conference on
Conference_Location :
New Orleans, LA
Print_ISBN :
0-7803-3932-0
Type :
conf
DOI :
10.1109/IECON.1997.671037
Filename :
671037
Link To Document :
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