• DocumentCode
    322902
  • Title

    Robust temperature control in the measurement of high temperature vapor pressures

  • Author

    Ingram, J.E. ; Hodel, A.S. ; Kirkici, H.

  • Author_Institution
    Dept. of Electr. Eng., Auburn Univ., AL, USA
  • Volume
    1
  • fYear
    1997
  • fDate
    9-14 Nov 1997
  • Firstpage
    149
  • Abstract
    The problem of measuring the vapor pressure of high temperature materials likely to be used in a space environment is considered. The purpose of this experiment is to determine whether these materials are suitable for use as protective coatings for optical components and photovoltaic materials in a space environment. An ultra high vacuum (UHV) chamber is used to measure the vapor pressure of the candidate materials at elevated temperatures up to 2000 K and background vacuum pressures down to 10-8 Pa. Because the temperature of the sample must be constant during the experiments, an automated temperature control system is designed and constructed. In this paper, the results of the data and the temperature control system are discussed
  • Keywords
    protective coatings; robust control; temperature control; vapour pressure measurement; 10E-8 Pa; 2000 K; automated temperature control system; background vacuum pressures; high temperature vapor pressures measurement; optical components; photovoltaic materials; protective coatings; robust temperature control; space environment; ultra high vacuum chamber; Coatings; Extraterrestrial measurements; Optical devices; Optical materials; Pressure measurement; Protection; Robust control; Temperature control; Temperature measurement; Vacuum systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, Control and Instrumentation, 1997. IECON 97. 23rd International Conference on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    0-7803-3932-0
  • Type

    conf

  • DOI
    10.1109/IECON.1997.671037
  • Filename
    671037