• DocumentCode
    3229076
  • Title

    EuMnO3 effects on structure and electrical properties of chemical solution deposited BiFeO3 thin films

  • Author

    Do, D. ; Kim, J.W. ; Kim, G.H. ; Bae, Y.R. ; Kim, E.S. ; Kim, S.S. ; Lee, M.H. ; Cho, H.J. ; Cho, J.H. ; Park, J.S. ; Kim, D.J. ; Sung, Y.S. ; Kim, M.H. ; Song, T.K.

  • Author_Institution
    Dept. of Phys., Changwon Nat. Univ., Changwon, South Korea
  • fYear
    2011
  • fDate
    24-27 July 2011
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Multiferroic (Bi1-xEux)(Fe1-xMnx)O3 (BEFM-x, x=0.00, 0.02, 0.04, 0.06, 0.08, and 0.10) thin films were prepared on Pt(111)/Ti/SiO2/Si(100) substrates by using a chemical solution deposition method. Compared to the pure BiFeO3 thin film, improved ferroelectric property and reduced leakage current density were observed in the co-doped BEFM-x thin films. Among them, the BEFM-0.08 thin film capacitor showed the best properties. The values of remnant polarization (2Pr) and coercive electric field (2Ec) were 93 μC/cm2 and 531 kV/cm at an applied electric field of 932 kV/cm, respectively. The leakage current density of the BEFM-0.08 thin film capacitor was 2.5×10-5 A/cm2 at 100 kV/cm.
  • Keywords
    bismuth compounds; dielectric polarisation; europium compounds; ferroelectric coercive field; ferroelectric thin films; leakage currents; liquid phase deposition; multiferroics; (Bi1-xEux)(Fe1-xMnx)O3; Pt-Ti-SiO2-Si; Si; chemical solution deposition; coercive electric field; electrical properties; ferroelectric property; leakage current density; multiferroic thin film capacitors; remnant polarization; structural properties; Capacitors; Chemicals; Current measurement; Electric fields; Leakage current; Manganese; Temperature measurement; chemical solution deposition; co-doped BiFeO3 thin films; ferroelectric properties; leakage current;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics (ISAF/PFM), 2011 International Symposium on and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    978-1-4577-1162-6
  • Electronic_ISBN
    978-1-4577-1161-9
  • Type

    conf

  • DOI
    10.1109/ISAF.2011.6014145
  • Filename
    6014145