DocumentCode
3229081
Title
Nanomagnetic logic: Investigations on field-coupled computing devices by experiment-based compact modeling
Author
Breitkreutz, Stephan ; Kiermaier, Josef ; Yilmaz, Cenk ; Ju, Xueming ; Csaba, György ; Schmitt-Landsiedel, Doris ; Becherer, Markus
Author_Institution
Lehrstuhl fur Tech. Elektron., Tech. Univ. Munchen, Munich, Germany
fYear
2011
fDate
15-18 Aug. 2011
Firstpage
1248
Lastpage
1251
Abstract
A compact model for the design of nanomagnetic logic based on experiments with field-coupled nanomagnets is presented. Two different types of dots for signal propagation in a wire and logic operations in a majority gate are introduced. The switching behavior and the interaction of fabricated nanomagnets is analyzed by MOKE measurements. Partial irradiation with a focused ion beam (FIB) is used to influence the switching and the interaction of the utilized nanomagnets. Experimental results are used to calibrate the nanomagnetic compact models. Investigations on nanomagnetic wires and an XOR gate are performed. Simulations show that the error rate mainly depends on the switching field variations from dot to dot and the strength of the coupling field between the dots. High coupling fields by small gaps between the nanomagnets and accurate control of switching field variations by partial FIB irradiation turn out to be the key for realizing reliable NML systems.
Keywords
focused ion beam technology; logic gates; magnetic logic; nanomagnetics; MOKE measurement; XOR gate; experiment-based compact modeling; fabricated nanomagnet; field-coupled computing device; field-coupled nanomagnet; focused ion beam; logic operation; nanomagnetic compact model; nanomagnetic logic; nanomagnetic wire; reliable NML system; signal propagation; switching behavior; switching field variation; Couplings; Error analysis; Logic gates; Magnetization; Radiation effects; Switches; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location
Portland, OR
ISSN
1944-9399
Print_ISBN
978-1-4577-1514-3
Electronic_ISBN
1944-9399
Type
conf
DOI
10.1109/NANO.2011.6144542
Filename
6144542
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