Title :
Microstructure and dielectric properties of (Sr0.88Bi0.08)TiO3-Bi(Mg1/2Ti1/2)O3 ceramics
Author :
Hao, Hua ; Xiong, Bo ; Liu, Haxing ; Cao, Minghe ; Zhiyong Yu
Author_Institution :
Sch. of Mater. Sci. & Eng., Wuhan Univ. of Technol., Wuhan, China
Abstract :
In the present study, (1-x)(Sr0.88Bi0.08)TiO3-xBi(Mg0.5Ti0.5)O3 (SBT-BMT) system was synthesized using conventional solid state processing. X-ray diffraction (XRD) and SEM testings were employed to determine the phase constitution and microstructure of ceramics. SBT-BMT ceramics exhibited moderate dielectric permittivities (εr) (>;1100 at RT) and low dielectric loss (0.07%) over the temperature range from -20 to 200°C, with flat temperature coefficients of permittivity. In addition, SBT-BMT ceramics were observed to possess dielectric relaxation characteristics and energy densities, being on the order of 1.4 J/cm3 at 180 kV/cm was observed for the 0.8S0.88B0.08T-0.2BMT ceramics.
Keywords :
X-ray diffraction; bismuth compounds; ceramics; crystal microstructure; dielectric losses; dielectric relaxation; magnesium compounds; permittivity; scanning electron microscopy; strontium compounds; (Sr0.88Bi0.12)TiO3-Bi(Mg0.5Ti0.5)O3; SBT-BMT ceramics; SBT-BMT system; SEM testing; X-ray diffraction; XRD testing; dielectric loss; dielectric permittivities; dielectric properties; dielectric relaxation characteristics; energy densities; flat temperature coefficients; microstructure; phase constitution; solid state processing; temperature -20 degC to 200 degC; Temperature; SBT-BMT; capacitor; dielectric properties;
Conference_Titel :
Applications of Ferroelectrics (ISAF/PFM), 2011 International Symposium on and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1162-6
Electronic_ISBN :
978-1-4577-1161-9
DOI :
10.1109/ISAF.2011.6014147
