Title :
Design and characterisation of 16×1 parallel outputs SPAD array in 0.18 um CMOS technology
Author :
Isaak, Suhaila ; Pitter, M.C. ; Bull, S. ; Harrison, I.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Nottingham, Nottingham, UK
Abstract :
The design, simulation, fabrication, and characterisation of a silicon single photon avalanche diode (SPAD) array with integral quenching and discriminator circuits is presented. The array is a 16×1 parallel output SPAD array which comprised active quenched SPAD circuit in each pixel, and was fabricated in a UMC 0.18μm CMOS process. The SPADs were operated in the Geiger mode where the applied reverse bias voltage (VRB) is greater than the breakdown voltage (VBD) at 11.03 V. A digital circuitry to control the SPAD array and perform processing the data provided by it was designed in VHDL and implemented on an FPGA chip. At room temperature, the dark count was found approximately 12875 counts per second (cps) for most of the 16 SPAD pixels and the dead time was estimated to be 40 ns. The apparent detection probability (ADE) from LED with λ= 470 nm was 17.4% at 1.5 V above VBD.
Keywords :
CMOS integrated circuits; avalanche photodiodes; discriminators; electric breakdown; field programmable gate arrays; hardware description languages; integrated circuit design; probability; CMOS technology; FPGA chip; Geiger mode; UMC CMOS process; VHDL; active quenched SPAD circuit; apparent detection probability; applied reverse bias voltage; breakdown voltage; digital circuitry; discriminator circuit; integral quenching; parallel output SPAD array; silicon single photon avalanche diode; size 0.18 mum; voltage 11.03 V; Arrays; Avalanche photodiodes; CMOS integrated circuits; CMOS process; Photonics; Pixel; Signal to noise ratio; Avalanche diode; CMOS SPAD; FPGA; parallel output;
Conference_Titel :
Circuits and Systems (APCCAS), 2010 IEEE Asia Pacific Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-7454-7
DOI :
10.1109/APCCAS.2010.5774894