• DocumentCode
    3229562
  • Title

    The dependence of fingerprints relevant to PDs on degradation time and test voltage

  • Author

    Bozzo, R. ; Gemme, C. ; Guastavino, F.

  • Author_Institution
    Dipt. di Ingegneria Elettrica, Genoa Univ., Italy
  • Volume
    2
  • fYear
    1996
  • fDate
    20-23 Oct 1996
  • Firstpage
    500
  • Abstract
    Partial Discharge (PD) digital measurement systems allow one to obtain derived quantities (fingerprints) which can be related to the morphology of the discharge site and to its degradation level. Nevertheless fingerprint values can change depending on several parameters characterising the experiments. In this paper, the results of PD tests evidence the dependence of some of the fingerprints, relevant to treeing tests and surface PD tests, on the degradation time and on the applied voltage. As such a dependence is different for different kinds of discharge sites, it is proposed to consider the dependence on degradation time or on the applied voltage as a complementary information useful to perform the diagnostic of insulation systems
  • Keywords
    insulation testing; partial discharges; surface discharges; trees (electrical); PDs; degradation time; derived quantities; discharge site; fingerprints; insulation system diagnostics; surface PD tests; test voltage; treeing tests; Degradation; Fingerprint recognition; Insulation; Partial discharge measurement; Partial discharges; Performance evaluation; Surface discharges; Surface morphology; System testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
  • Conference_Location
    Millbrae, CA
  • Print_ISBN
    0-7803-3580-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.1996.564519
  • Filename
    564519