• DocumentCode
    3229864
  • Title

    Towards realistic atomic-scale modeling of nanoscale devices

  • Author

    Blom, Anders ; Stokbro, Kurt

  • Author_Institution
    QuantumWise A/S, Copenhagen, Denmark
  • fYear
    2011
  • fDate
    15-18 Aug. 2011
  • Firstpage
    1487
  • Lastpage
    1492
  • Abstract
    On the nanoscale, electrical currents behave radically different compared to on the microscale. As the active regions become comparable to or smaller than the mean-free path of the material, it becomes necessary to describe the electron transport by quantum-mechanical methods instead of using classical relations like Ohm´s law. Over the past decade, methods for computing electron tunneling currents in nanosized junctions have evolved steadily, and are now approaching a sophistication where they can provide real assistance in the development of novel semiconductor materials and devices. At the same time, the industry´s demand for such solutions is rising rapidly to meet the challenges both above and under the 16 nm node. In this paper we provide an overview of the current state-of-the-art of the field of how to model electrical currents on the nanoscale, using atomic-scale simulations.
  • Keywords
    electron mobility; nanoelectronics; semiconductor device models; technology CAD (electronics); tunnelling; active regions; atomic-scale modeling; atomic-scale simulation; electron transport; electron tunneling current; nanoscale devices; nanoscale electrical currents; nanosized junctions; quantum-mechanical method; semiconductor device; semiconductor materials; Boundary conditions; Computational modeling; Electric potential; Electrodes; Logic gates; Materials; Tunneling; Nanoelectronics; atomic-scale simulations; multi-scale; phonons; transport;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
  • Conference_Location
    Portland, OR
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4577-1514-3
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2011.6144584
  • Filename
    6144584