DocumentCode
3229864
Title
Towards realistic atomic-scale modeling of nanoscale devices
Author
Blom, Anders ; Stokbro, Kurt
Author_Institution
QuantumWise A/S, Copenhagen, Denmark
fYear
2011
fDate
15-18 Aug. 2011
Firstpage
1487
Lastpage
1492
Abstract
On the nanoscale, electrical currents behave radically different compared to on the microscale. As the active regions become comparable to or smaller than the mean-free path of the material, it becomes necessary to describe the electron transport by quantum-mechanical methods instead of using classical relations like Ohm´s law. Over the past decade, methods for computing electron tunneling currents in nanosized junctions have evolved steadily, and are now approaching a sophistication where they can provide real assistance in the development of novel semiconductor materials and devices. At the same time, the industry´s demand for such solutions is rising rapidly to meet the challenges both above and under the 16 nm node. In this paper we provide an overview of the current state-of-the-art of the field of how to model electrical currents on the nanoscale, using atomic-scale simulations.
Keywords
electron mobility; nanoelectronics; semiconductor device models; technology CAD (electronics); tunnelling; active regions; atomic-scale modeling; atomic-scale simulation; electron transport; electron tunneling current; nanoscale devices; nanoscale electrical currents; nanosized junctions; quantum-mechanical method; semiconductor device; semiconductor materials; Boundary conditions; Computational modeling; Electric potential; Electrodes; Logic gates; Materials; Tunneling; Nanoelectronics; atomic-scale simulations; multi-scale; phonons; transport;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location
Portland, OR
ISSN
1944-9399
Print_ISBN
978-1-4577-1514-3
Electronic_ISBN
1944-9399
Type
conf
DOI
10.1109/NANO.2011.6144584
Filename
6144584
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