• DocumentCode
    3230258
  • Title

    Comparative material issues for fast reliable switching in STT-RAMs

  • Author

    Munira, Kamaram ; Soffa, William A. ; Ghosh, Avik W.

  • Author_Institution
    Charles L. Brown Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA
  • fYear
    2011
  • fDate
    15-18 Aug. 2011
  • Firstpage
    1403
  • Lastpage
    1408
  • Abstract
    With its fast write and read, small cell size, non-volatility and excellent endurance, Spin Transfer Torque-RAM (STT-RAM) has a high potential of dominating the embedded and standalone memory world in the near future. In this paper, the suitability of different classes of magnetic materials constituting the STT-RAM free layer is reviewed for faster switching and thermal stability. We identify the following material classes for faster switching in the thermally stable free-layer of a STT-RAM: (a) In-plane materials with high HK and low MS. While the high HK deters the magnetization during the easy to hard axis switching, it helps with switching past the equator, making the switching speeds for high and low HK materials comparable. However, high HK materials benefit from higher thermal stability. (b) Perpendicular materials with low damping have the same switching speed as in-plane materials but greater switching probability because of a lower critical current. The demagnetization field helps the free layer to start switching to the hard axis, but hinders it from switching further to the easy axis beyond the equator. (c) Anti-ferromagnetically capped partially-perpendicular materials. Capping with a Va layer decreases the demagnetization field, which promotes faster switching.
  • Keywords
    magnetic materials; magnetic switching; magnetic tunnelling; magnetisation; random-access storage; thermal stability; torque; STT-RAM; comparative material issues; magnetic materials; magnetization; perpendicular materials; reliable switching; spin transfer torque-RAM; thermal stability; Conferences; Magnetomechanical effects; Materials; Perpendicular magnetic anisotropy; Random access memory; Switches; Spin transfer torque random access memory (STT-RAM); magnetic tunnel junction; spin torque; spin transfer switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
  • Conference_Location
    Portland, OR
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4577-1514-3
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2011.6144606
  • Filename
    6144606