• DocumentCode
    3230404
  • Title

    Full-chip thermal analysis for the early design stage via generalized integral transforms

  • Author

    Huang, Pei-Yu ; Lin, Chih-Kang ; Lee, Yu-Min

  • Author_Institution
    Nat. Chiao Tung Univ., Hsinchu
  • fYear
    2008
  • fDate
    21-24 March 2008
  • Firstpage
    462
  • Lastpage
    467
  • Abstract
    The capability of predicting the temperature profile is critically important for circuit timing estimation, leakage reduction, power estimation, hotspot avoidance, and reliability concerns during modern IC designs. This paper presents an accurate and fast analytical full-chip thermal simulator for the early-stage temperature-aware chip design. By using the technique of generalized integral transforms (GIT), our proposed method can accurately estimate the temperature distribution of full-chip with very small truncation points of bases in the spatial domain. We also develop a fast Fourier transform (FFT) like evaluating algorithm to efficiently evaluate the temperature distribution. Experimental results confirm that our GIT based analyzer can achieve an order of magnitude speedup compared with a highly efficient Green´s function based method.
  • Keywords
    VLSI; fast Fourier transforms; integrated circuit design; integrated circuit modelling; integrated circuit packaging; fast Fourier transform; full-chip thermal analysis; generalized integral transforms; temperature distribution; temperature-aware chip design; Optical character recognition software; Quadratic programming;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2008. ASPDAC 2008. Asia and South Pacific
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4244-1921-0
  • Electronic_ISBN
    978-1-4244-1922-7
  • Type

    conf

  • DOI
    10.1109/ASPDAC.2008.4483995
  • Filename
    4483995