DocumentCode
3230892
Title
A domain knowledge based approach for medical image retrieval
Author
Pan, Haiwei ; Feng, Xiaoning ; Han, Qilong ; Yin, Guisheng
Author_Institution
Coll. of Comput. Sci. & Technol., Harbin Eng. Univ., Harbin, China
fYear
2010
fDate
23-26 Sept. 2010
Firstpage
1677
Lastpage
1684
Abstract
The high incidence of brain disease, especially brain tumor, has increased significantly in recent years. It is becoming more and more concernful to discover knowledge through mining medical brain image to aid doctors´ diagnosis. Image mining is the important branch of data mining. It is more than just an extension of data mining to image domain but an interdisciplinary endeavor. Image clustering and similarity retrieval are two basilic parts of image mining. In this paper, we introduce a notion of image sequence similarity patterns (ISSP) for medical image database. ISSP refer to the longest similar and continuous sub-patterns hidden in two objects each of which contains an image sequence. These patterns are significant in medical images because the similarity for two medical images is not important, but rather, it is the similarity of objects each of which has an image sequence that is meaningful. We design the new algorithms with the guidance of the domain knowledge to discover the possible Space-Occupying Lesion (PSO) in brain images and ISSP for similarity retrieval. Our experiments demonstrate that the results of similarity retrieval are meaningful and interesting to medical doctors.
Keywords
data mining; image retrieval; image sequences; medical image processing; pattern clustering; brain disease; brain tumor; data mining; domain knowledge; image clustering; image mining; image sequence similarity patterns; knowledge discovery; medical image retrieval; space-occupying lesion; Biomedical imaging; Indium phosphide; Pixel; Data mining; domain knowledge; image mining; similarity retrieval;
fLanguage
English
Publisher
ieee
Conference_Titel
Bio-Inspired Computing: Theories and Applications (BIC-TA), 2010 IEEE Fifth International Conference on
Conference_Location
Changsha
Print_ISBN
978-1-4244-6437-1
Type
conf
DOI
10.1109/BICTA.2010.5645250
Filename
5645250
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