Title :
High Yield Mmic Design Using Improved Random Walk Approach
Author :
Wang, Y. ; Zhu, L.
Author_Institution :
Department of Electrical Engineering, Zhejiang University, China
Keywords :
Circuits; MMICs; Manufacturing;
Conference_Titel :
Microwave Conference, 1992. APMC 92. 1992 Asia-Pacific
Conference_Location :
Adelaide, South Australia
Print_ISBN :
0-7803-0549-3
DOI :
10.1109/APMC.1992.672045
